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Remove some unused CFG define.

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undef CFG_DRAM_TEST
This commit is contained in:
roy zang 2006-11-03 13:10:00 +08:00 committed by Zang Tiefei
parent 99c09c4dec
commit 4831c8b8a9
1 changed files with 3 additions and 12 deletions
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15
include/configs/mpc7448hpc2.h
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@ -149,10 +149,6 @@
#define CONFIG_BOOTFILE zImage.initrd.elf
#define CONFIG_LOADADDR 0x400000
#define CONFIG_TESTDRAMDATA y
#define CONFIG_TESTDRAMADDRESS n
#define CONFIG_TESETDRAMWALK n
/*-------------------------------------------------------------------------- */
#define CONFIG_LOADS_ECHO 0 /* echo off for serial download */
@ -163,10 +159,6 @@
#define CONFIG_BOOTP_MASK (CONFIG_BOOTP_DEFAULT | \
CONFIG_BOOTP_BOOTFILESIZE)
/* Flash banks JFFS2 should use */
#define CFG_JFFS2_FIRST_BANK 1
#define CFG_JFFS2_NUM_BANKS 1
#define CONFIG_COMMANDS (CONFIG_CMD_DFL \
| CFG_CMD_ASKENV \
| CFG_CMD_CACHE \
@ -174,7 +166,6 @@
| CFG_CMD_I2C \
| CFG_CMD_SDRAM \
| CFG_CMD_EEPROM \
| CFG_CMD_NET \
| CFG_CMD_FLASH \
| CFG_CMD_ENV \
| CFG_CMD_BSP \
@ -220,7 +211,7 @@
* CFG_DRAM_TEST_DATA - Enables test for shorted or open data lines
* Environment variable 'test_dram_data' must be
* set to 'y'.
* CFG_DRAM_TEST_DATA - Enables test to verify that each word is uniquely
* CFG_DRAM_TEST_ADDRESS - Enables test to verify that each word is uniquely
* addressable. Environment variable
* 'test_dram_address' must be set to 'y'.
* CFG_DRAM_TEST_WALK - Enables test a 64-bit walking ones pattern test.
@ -228,10 +219,10 @@
* Environment variable 'test_dram_walk' must be
* set to 'y'.
*/
#define CFG_DRAM_TEST
#if defined(CFG_DRAM_TEST)
#undef CFG_DRAM_TEST
#define CFG_MEMTEST_START 0x00400000 /* memtest works on */
#define CFG_MEMTEST_END 0x07c00000 /* 4 ... 124 MB in DRAM */
#if defined(CFG_DRAM_TEST)
#define CFG_DRAM_TEST_DATA
#define CFG_DRAM_TEST_ADDRESS
#define CFG_DRAM_TEST_WALK