e180c2b129
The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass <sjg@chromium.org>
199 lines
6.0 KiB
C
199 lines
6.0 KiB
C
// SPDX-License-Identifier: GPL-2.0+
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/*
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* Tests for the driver model ADC API
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*
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* Copyright (c) 2015 Samsung Electronics
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* Przemyslaw Marczak <p.marczak@samsung.com>
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*/
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#include <common.h>
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#include <adc.h>
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#include <dm.h>
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#include <dm/root.h>
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#include <dm/util.h>
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#include <dm/test.h>
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#include <errno.h>
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#include <fdtdec.h>
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#include <power/regulator.h>
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#include <power/sandbox_pmic.h>
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#include <sandbox-adc.h>
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#include <test/test.h>
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#include <test/ut.h>
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static int dm_test_adc_bind(struct unit_test_state *uts)
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{
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struct udevice *dev;
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unsigned int channel_mask;
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ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
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ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name);
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ut_assertok(adc_channel_mask(dev, &channel_mask));
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ut_asserteq((1 << SANDBOX_ADC_CHANNELS) - 1, channel_mask);
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return 0;
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}
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DM_TEST(dm_test_adc_bind, UT_TESTF_SCAN_FDT);
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static int dm_test_adc_wrong_channel_selection(struct unit_test_state *uts)
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{
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struct udevice *dev;
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ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
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ut_asserteq(-EINVAL, adc_start_channel(dev, SANDBOX_ADC_CHANNELS));
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return 0;
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}
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DM_TEST(dm_test_adc_wrong_channel_selection, UT_TESTF_SCAN_FDT);
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static int dm_test_adc_supply(struct unit_test_state *uts)
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{
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struct udevice *supply;
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struct udevice *dev;
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int uV;
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ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
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/* Test Vss value - predefined 0 uV */
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ut_assertok(adc_vss_value(dev, &uV));
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ut_asserteq(SANDBOX_ADC_VSS_VALUE, uV);
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/* Test Vdd initial value - buck2 */
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ut_assertok(adc_vdd_value(dev, &uV));
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ut_asserteq(SANDBOX_BUCK2_INITIAL_EXPECTED_UV, uV);
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/* Change Vdd value - buck2 manual preset */
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ut_assertok(regulator_get_by_devname(SANDBOX_BUCK2_DEVNAME, &supply));
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ut_assertok(regulator_set_value(supply, SANDBOX_BUCK2_SET_UV));
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ut_asserteq(SANDBOX_BUCK2_SET_UV, regulator_get_value(supply));
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/* Update ADC platdata and get new Vdd value */
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ut_assertok(adc_vdd_value(dev, &uV));
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ut_asserteq(SANDBOX_BUCK2_SET_UV, uV);
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/* Disable buck2 and test ADC supply enable function */
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ut_assertok(regulator_set_enable(supply, false));
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ut_asserteq(false, regulator_get_enable(supply));
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/* adc_start_channel() should enable the supply regulator */
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ut_assertok(adc_start_channel(dev, 0));
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ut_asserteq(true, regulator_get_enable(supply));
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return 0;
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}
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DM_TEST(dm_test_adc_supply, UT_TESTF_SCAN_FDT);
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struct adc_channel adc_channel_test_data[] = {
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{ 0, SANDBOX_ADC_CHANNEL0_DATA },
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{ 1, SANDBOX_ADC_CHANNEL1_DATA },
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{ 2, SANDBOX_ADC_CHANNEL2_DATA },
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{ 3, SANDBOX_ADC_CHANNEL3_DATA },
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};
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static int dm_test_adc_single_channel_conversion(struct unit_test_state *uts)
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{
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struct adc_channel *tdata = adc_channel_test_data;
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unsigned int i, data;
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struct udevice *dev;
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ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
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/* Test each ADC channel's value */
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for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
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ut_assertok(adc_start_channel(dev, tdata->id));
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ut_assertok(adc_channel_data(dev, tdata->id, &data));
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ut_asserteq(tdata->data, data);
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}
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return 0;
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}
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DM_TEST(dm_test_adc_single_channel_conversion, UT_TESTF_SCAN_FDT);
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static int dm_test_adc_multi_channel_conversion(struct unit_test_state *uts)
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{
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struct adc_channel channels[SANDBOX_ADC_CHANNELS];
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struct udevice *dev;
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struct adc_channel *tdata = adc_channel_test_data;
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unsigned int i, channel_mask;
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channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
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ADC_CHANNEL(2) | ADC_CHANNEL(3);
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/* Start multi channel conversion */
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ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
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ut_assertok(adc_start_channels(dev, channel_mask));
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ut_assertok(adc_channels_data(dev, channel_mask, channels));
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/* Compare the expected and returned conversion data. */
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for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
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ut_asserteq(tdata->data, channels[i].data);
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return 0;
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}
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DM_TEST(dm_test_adc_multi_channel_conversion, UT_TESTF_SCAN_FDT);
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static int dm_test_adc_single_channel_shot(struct unit_test_state *uts)
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{
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struct adc_channel *tdata = adc_channel_test_data;
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unsigned int i, data;
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for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
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/* Start single channel conversion */
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ut_assertok(adc_channel_single_shot("adc@0", tdata->id, &data));
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/* Compare the expected and returned conversion data. */
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ut_asserteq(tdata->data, data);
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}
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return 0;
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}
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DM_TEST(dm_test_adc_single_channel_shot, UT_TESTF_SCAN_FDT);
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static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts)
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{
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struct adc_channel channels[SANDBOX_ADC_CHANNELS];
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struct adc_channel *tdata = adc_channel_test_data;
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unsigned int i, channel_mask;
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channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
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ADC_CHANNEL(2) | ADC_CHANNEL(3);
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/* Start single call and multi channel conversion */
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ut_assertok(adc_channels_single_shot("adc@0", channel_mask, channels));
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/* Compare the expected and returned conversion data. */
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for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
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ut_asserteq(tdata->data, channels[i].data);
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return 0;
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}
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DM_TEST(dm_test_adc_multi_channel_shot, UT_TESTF_SCAN_FDT);
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static const int dm_test_adc_uV_data[SANDBOX_ADC_CHANNELS] = {
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((u64)SANDBOX_ADC_CHANNEL0_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
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SANDBOX_ADC_DATA_MASK,
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((u64)SANDBOX_ADC_CHANNEL1_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
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SANDBOX_ADC_DATA_MASK,
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((u64)SANDBOX_ADC_CHANNEL2_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
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SANDBOX_ADC_DATA_MASK,
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((u64)SANDBOX_ADC_CHANNEL3_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
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SANDBOX_ADC_DATA_MASK,
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};
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static int dm_test_adc_raw_to_uV(struct unit_test_state *uts)
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{
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struct adc_channel *tdata = adc_channel_test_data;
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unsigned int i, data;
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struct udevice *dev;
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int uV;
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ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
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/* Test each ADC channel's value in microvolts */
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for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
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ut_assertok(adc_start_channel(dev, tdata->id));
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ut_assertok(adc_channel_data(dev, tdata->id, &data));
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ut_assertok(adc_raw_to_uV(dev, data, &uV));
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ut_asserteq(dm_test_adc_uV_data[i], uV);
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}
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return 0;
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}
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DM_TEST(dm_test_adc_raw_to_uV, UT_TESTF_SCAN_FDT);
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