u-boot/test/dm/serial.c
Simon Glass f7ae49fc4f common: Drop log.h from common header
Move this header out of the common header.

Signed-off-by: Simon Glass <sjg@chromium.org>
2020-05-18 21:19:18 -04:00

72 lines
2.0 KiB
C

// SPDX-License-Identifier: GPL-2.0
/*
* Copyright (c) 2018, STMicroelectronics
*/
#include <common.h>
#include <log.h>
#include <serial.h>
#include <dm.h>
#include <dm/test.h>
#include <test/ut.h>
static int dm_test_serial(struct unit_test_state *uts)
{
struct serial_device_info info_serial = {0};
struct udevice *dev_serial;
uint value_serial;
ut_assertok(uclass_get_device_by_name(UCLASS_SERIAL, "serial",
&dev_serial));
ut_assertok(serial_tstc());
/*
* test with default config which is the only one supported by
* sandbox_serial driver
*/
ut_assertok(serial_setconfig(dev_serial, SERIAL_DEFAULT_CONFIG));
ut_assertok(serial_getconfig(dev_serial, &value_serial));
ut_assert(value_serial == SERIAL_DEFAULT_CONFIG);
ut_assertok(serial_getinfo(dev_serial, &info_serial));
ut_assert(info_serial.type == SERIAL_CHIP_UNKNOWN);
ut_assert(info_serial.addr == SERIAL_DEFAULT_ADDRESS);
ut_assert(info_serial.clock == SERIAL_DEFAULT_CLOCK);
/*
* test with a parameter which is NULL pointer
*/
ut_asserteq(-EINVAL, serial_getconfig(dev_serial, NULL));
ut_asserteq(-EINVAL, serial_getinfo(dev_serial, NULL));
/*
* test with a serial config which is not supported by
* sandbox_serial driver: test with wrong parity
*/
ut_asserteq(-ENOTSUPP,
serial_setconfig(dev_serial,
SERIAL_CONFIG(SERIAL_PAR_ODD,
SERIAL_8_BITS,
SERIAL_ONE_STOP)));
/*
* test with a serial config which is not supported by
* sandbox_serial driver: test with wrong bits number
*/
ut_asserteq(-ENOTSUPP,
serial_setconfig(dev_serial,
SERIAL_CONFIG(SERIAL_PAR_NONE,
SERIAL_6_BITS,
SERIAL_ONE_STOP)));
/*
* test with a serial config which is not supported by
* sandbox_serial driver: test with wrong stop bits number
*/
ut_asserteq(-ENOTSUPP,
serial_setconfig(dev_serial,
SERIAL_CONFIG(SERIAL_PAR_NONE,
SERIAL_8_BITS,
SERIAL_TWO_STOP)));
return 0;
}
DM_TEST(dm_test_serial, DM_TESTF_SCAN_FDT);