Extend existing DM tee tests adding test coverage for reverse RPC calls.
Currently this commit only adds tests for I2C requests from TEE driver
to TEE supplicant, for instance reading/writing data to emulated i2c
eeprom defines in standard sandbox test device tree
(arch/sandbox/dts/test.dtb):
=> i2c bus
Bus 0: i2c@0 (active 0)
2c: eeprom@2c, offset len 1, flags 0
...
Running TEE tests:
=> ut dm tee
Test: dm_test_tee: tee.c
Test: dm_test_tee: tee.c (flat tree)
Failures: 0
Signed-off-by: Igor Opaniuk <igor.opaniuk@foundries.io>
Reviewed-by: Simon Glass <sjg@chromium.org>
Acked-by: Etienne Carriere <etienne.carriere@linaro.org>
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.
This will allow adding other test flags without confusion.
Signed-off-by: Simon Glass <sjg@chromium.org>
These header file should not be included in other header files. Remove
them and add to each individual file. Add test/test.h to test/ui.h since
that is a reasonable place.
Signed-off-by: Simon Glass <sjg@chromium.org>
At present dm/device.h includes the linux-compatible features. This
requires including linux/compat.h which in turn includes a lot of headers.
One of these is malloc.h which we thus end up including in every file in
U-Boot. Apart from the inefficiency of this, it is problematic for sandbox
which needs to use the system malloc() in some files.
Move the compatibility features into a separate header file.
Signed-off-by: Simon Glass <sjg@chromium.org>
Tests the TEE uclass with a sandbox tee driver.
Reviewed-by: Simon Glass <sjg@chromium.org>
Signed-off-by: Jens Wiklander <jens.wiklander@linaro.org>
[trini: initialize session to 0 in dm_test_tee]
Signed-off-by: Tom Rini <trini@konsulko.com>
