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dm: Rename DM test flags to make them more generic

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The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.

This will allow adding other test flags without confusion.

Signed-off-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Simon Glass
2020-07-28 19:41:12 -06:00
committed by Tom Rini
parent bd34715599
commit e180c2b129
77 changed files with 301 additions and 300 deletions
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12
test/dm/led.c
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@@ -26,7 +26,7 @@ static int dm_test_led_base(struct unit_test_state *uts)
return 0;
}
DM_TEST(dm_test_led_base, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
DM_TEST(dm_test_led_base, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Test of the LED 'default-state' device tree property */
static int dm_test_led_default_state(struct unit_test_state *uts)
@@ -45,7 +45,7 @@ static int dm_test_led_default_state(struct unit_test_state *uts)
return 0;
}
DM_TEST(dm_test_led_default_state, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
DM_TEST(dm_test_led_default_state, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Test of the led uclass using the led_gpio driver */
static int dm_test_led_gpio(struct unit_test_state *uts)
@@ -70,7 +70,7 @@ static int dm_test_led_gpio(struct unit_test_state *uts)
return 0;
}
DM_TEST(dm_test_led_gpio, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
DM_TEST(dm_test_led_gpio, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Test that we can toggle LEDs */
static int dm_test_led_toggle(struct unit_test_state *uts)
@@ -95,7 +95,7 @@ static int dm_test_led_toggle(struct unit_test_state *uts)
return 0;
}
DM_TEST(dm_test_led_toggle, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
DM_TEST(dm_test_led_toggle, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Test obtaining an LED by label */
static int dm_test_led_label(struct unit_test_state *uts)
@@ -116,7 +116,7 @@ static int dm_test_led_label(struct unit_test_state *uts)
return 0;
}
DM_TEST(dm_test_led_label, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
DM_TEST(dm_test_led_label, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Test LED blinking */
#ifdef CONFIG_LED_BLINK
@@ -139,5 +139,5 @@ static int dm_test_led_blink(struct unit_test_state *uts)
return 0;
}
DM_TEST(dm_test_led_blink, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
DM_TEST(dm_test_led_blink, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
#endif