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test/dm: clk: Add clk_get_by_index[_nodev] test

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Add sample dm clk test for clk_get_by_index and
clk_get_by_index_nodev functionality code.

Cc: Stephen Warren <swarren@nvidia.com>
Signed-off-by: Jagan Teki <jagan@amarulasolutions.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Jagan Teki 2019-03-05 19:42:44 +05:30
parent dcb63fcd16
commit d7a672e35f
1 changed files with 21 additions and 0 deletions
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21
test/dm/clk.c
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@ -4,12 +4,33 @@
*/
#include <common.h>
#include <clk.h>
#include <dm.h>
#include <asm/clk.h>
#include <dm/test.h>
#include <linux/err.h>
#include <test/ut.h>
/* Base test of the clk uclass */
static int dm_test_clk_base(struct unit_test_state *uts)
{
struct udevice *dev;
struct clk clk_method1;
struct clk clk_method2;
/* Get the device using the clk device */
ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "clk-test", &dev));
/* Get the same clk port in 2 different ways and compare */
ut_assertok(clk_get_by_index(dev, 1, &clk_method1));
ut_assertok(clk_get_by_index_nodev(dev_ofnode(dev), 1, &clk_method2));
ut_asserteq(clk_method1.id, clk_method2.id);
return 0;
}
DM_TEST(dm_test_clk_base, DM_TESTF_SCAN_FDT);
static int dm_test_clk(struct unit_test_state *uts)
{
struct udevice *dev_fixed, *dev_fixed_factor, *dev_clk, *dev_test;