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mtd: nand: Mark the BBT as scanned prior to calling scan_bbt again

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Commit 35c204d8a9 (nand: reinstate lazy bad block scanning)
broke NAND_BBT_USE_FLASH feature.

Its git-log claimed that it reinstated the change as by commit
fb49454b1b ("nand: reinstate lazy bad block scanning"), but it moved
"chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);".

It causes recursion if scan_bbt does not find a flash based BBT
and tries to write one, and the attempt to erase the BBT area
causes a bad block check.

Reinstate commit ff49ea8977 (NAND: Mark the BBT as scanned prior to
calling scan_bbt.).

Signed-off-by: Masahiro Yamada <yamada.m@jp.panasonic.com>
Cc: Rostislav Lisovy <lisovy@merica.cz>
Cc: Heiko Schocher <hs@denx.de>
Cc: Scott Wood <scottwood@freescale.com>
This commit is contained in:
Masahiro Yamada 2014-12-26 22:20:57 +09:00 committed by Scott Wood
parent 756963d7da
commit bf80ee6e1d
1 changed files with 1 additions and 1 deletions
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2
drivers/mtd/nand/nand_base.c
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@ -635,8 +635,8 @@ static int nand_block_checkbad(struct mtd_info *mtd, loff_t ofs, int getchip,
struct nand_chip *chip = mtd->priv;
if (!(chip->options & NAND_BBT_SCANNED)) {
chip->scan_bbt(mtd);
chip->options |= NAND_BBT_SCANNED;
chip->scan_bbt(mtd);
}
if (!chip->bbt)