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dm: core: Test uclass_first/next_device() on probe failure

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Add some tests which check the behaviour of uclass_first_device() and
uclass_next_device() when probing of a device fails.

Signed-off-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Simon Glass 2017-04-23 20:10:44 -06:00
parent 30a570a983
commit 9856157259
3 changed files with 92 additions and 0 deletions
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19
arch/sandbox/dts/test.dts
View File

@ -289,6 +289,25 @@
};
};
probing {
compatible = "simple-bus";
test1 {
compatible = "denx,u-boot-probe-test";
};
test2 {
compatible = "denx,u-boot-probe-test";
};
test3 {
compatible = "denx,u-boot-probe-test";
};
test4 {
compatible = "denx,u-boot-probe-test";
};
};
pwrdom: power-domain {
compatible = "sandbox,power-domain";
#power-domain-cells = <1>;

1
include/dm/uclass-id.h
View File

@ -18,6 +18,7 @@ enum uclass_id {
UCLASS_TEST,
UCLASS_TEST_FDT,
UCLASS_TEST_BUS,
UCLASS_TEST_PROBE,
UCLASS_SPI_EMUL, /* sandbox SPI device emulator */
UCLASS_I2C_EMUL, /* sandbox I2C device emulator */
UCLASS_PCI_EMUL, /* sandbox PCI device emulator */

72
test/dm/test-fdt.c
View File

@ -12,6 +12,7 @@
#include <asm/io.h>
#include <dm/test.h>
#include <dm/root.h>
#include <dm/device-internal.h>
#include <dm/uclass-internal.h>
#include <dm/util.h>
#include <test/ut.h>
@ -99,6 +100,36 @@ UCLASS_DRIVER(testfdt) = {
.flags = DM_UC_FLAG_SEQ_ALIAS,
};
struct dm_testprobe_pdata {
int probe_err;
};
static int testprobe_drv_probe(struct udevice *dev)
{
struct dm_testprobe_pdata *pdata = dev_get_platdata(dev);
return pdata->probe_err;
}
static const struct udevice_id testprobe_ids[] = {
{ .compatible = "denx,u-boot-probe-test" },
{ }
};
U_BOOT_DRIVER(testprobe_drv) = {
.name = "testprobe_drv",
.of_match = testprobe_ids,
.id = UCLASS_TEST_PROBE,
.probe = testprobe_drv_probe,
.platdata_auto_alloc_size = sizeof(struct dm_testprobe_pdata),
};
UCLASS_DRIVER(testprobe) = {
.name = "testprobe",
.id = UCLASS_TEST_PROBE,
.flags = DM_UC_FLAG_SEQ_ALIAS,
};
int dm_check_devices(struct unit_test_state *uts, int num_devices)
{
struct udevice *dev;
@ -267,3 +298,44 @@ static int dm_test_fdt_offset(struct unit_test_state *uts)
}
DM_TEST(dm_test_fdt_offset,
DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT | DM_TESTF_FLAT_TREE);
/**
* Test various error conditions with uclass_first_device() and
* uclass_next_device()
*/
static int dm_test_first_next_device(struct unit_test_state *uts)
{
struct dm_testprobe_pdata *pdata;
struct udevice *dev, *parent = NULL;
int count;
int ret;
/* There should be 4 devices */
for (ret = uclass_first_device(UCLASS_TEST_PROBE, &dev), count = 0;
dev;
ret = uclass_next_device(&dev)) {
count++;
parent = dev_get_parent(dev);
}
ut_assertok(ret);
ut_asserteq(4, count);
/* Remove them and try again, with an error on the second one */
ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 1, &dev));
pdata = dev_get_platdata(dev);
pdata->probe_err = -ENOMEM;
device_remove(parent, DM_REMOVE_NORMAL);
ut_assertok(uclass_first_device(UCLASS_TEST_PROBE, &dev));
ut_asserteq(-ENOMEM, uclass_next_device(&dev));
ut_asserteq_ptr(dev, NULL);
/* Now an error on the first one */
ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 0, &dev));
pdata = dev_get_platdata(dev);
pdata->probe_err = -ENOENT;
device_remove(parent, DM_REMOVE_NORMAL);
ut_asserteq(-ENOENT, uclass_first_device(UCLASS_TEST_PROBE, &dev));
return 0;
}
DM_TEST(dm_test_first_next_device, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);