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dm: test: Add test case for dev_phys_to_bus()/dev_bus_to_phys()

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By reusing DT nodes already available in sandbox's test DT introduce a
test to validate dev_phys_to_bus()/dev_bus_to_phys().

Signed-off-by: Nicolas Saenz Julienne <nsaenzjulienne@suse.de>
Reviewed-by: Simon Glass <sjg@chromium.org>
Tested-by: Peter Robinson <pbrobinson@gmail.com>
Signed-off-by: Matthias Brugger <mbrugger@suse.com>
This commit is contained in:
Nicolas Saenz Julienne 2021-01-12 13:55:27 +01:00 committed by Matthias Brugger
parent 2a15a25c36
commit 30b20e6b3f
2 changed files with 38 additions and 0 deletions
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1
test/dm/Makefile
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@ -16,6 +16,7 @@ obj-$(CONFIG_UT_DM) += test-uclass.o
obj-$(CONFIG_UT_DM) += core.o
obj-$(CONFIG_UT_DM) += read.o
obj-$(CONFIG_UT_DM) += phys2bus.o
ifneq ($(CONFIG_SANDBOX),)
obj-$(CONFIG_ACPIGEN) += acpi.o
obj-$(CONFIG_ACPIGEN) += acpigen.o

37
test/dm/phys2bus.c Normal file
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@ -0,0 +1,37 @@
// SPDX-License-Identifier: GPL-2.0+
/*
* Copyright (c) 2020 Nicolas Saenz Julienne <nsaenzjulienne@suse.de>
*/
#include <common.h>
#include <dm.h>
#include <mapmem.h>
#include <phys2bus.h>
#include <dm/device.h>
#include <dm/ofnode.h>
#include <dm/root.h>
#include <dm/test.h>
#include <dm/uclass-internal.h>
#include <test/ut.h>
static int dm_test_phys_to_bus(struct unit_test_state *uts)
{
struct udevice *dev;
ofnode node;
node = ofnode_path("/mmio-bus@0");
ut_assert(ofnode_valid(node));
ut_assertok(uclass_get_device_by_ofnode(UCLASS_TEST_BUS, node, &dev));
/* In this case it should be transparent, no dma-ranges in parent bus */
ut_asserteq_addr((void*)0xfffffULL, (void*)dev_phys_to_bus(dev, 0xfffff));
ut_asserteq_addr((void*)0xfffffULL, (void*)(ulong)dev_bus_to_phys(dev, 0xfffff));
node = ofnode_path("/mmio-bus@0/subnode@0");
ut_assert(ofnode_valid(node));
ut_assertok(uclass_get_device_by_ofnode(UCLASS_TEST_FDT, node, &dev));
ut_asserteq_addr((void*)0x100fffffULL, (void*)dev_phys_to_bus(dev, 0xfffff));
ut_asserteq_addr((void*)0xfffffULL, (void*)(ulong)dev_bus_to_phys(dev, 0x100fffff));
return 0;
}
DM_TEST(dm_test_phys_to_bus, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);