test: Drop the UT_TESTF_LIVE_OR_FLAT flag
This was a workaround for a rare situation. Now that it will be more common and we have a proper fix, drop the flag. We can run both types of tests in the same sandbox executable, even if the flat device tree is modified. Signed-off-by: Simon Glass <sjg@chromium.org>
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@ -54,8 +54,6 @@ enum {
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UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
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/* do extra driver model init and uninit */
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UT_TESTF_DM = BIT(6),
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/* live or flat device tree, but not both in the same executable */
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UT_TESTF_LIVE_OR_FLAT = BIT(7),
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};
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/**
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@ -546,10 +546,6 @@ static int dm_test_ofnode_livetree_writing(struct unit_test_state *uts)
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struct udevice *dev;
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ofnode node;
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/* temporarily disable this test due to a failure fixed later */
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if (!of_live_active())
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return 0;
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/* Test enabling devices */
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node = ofnode_path("/usb@2");
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@ -588,7 +584,7 @@ static int dm_test_ofnode_livetree_writing(struct unit_test_state *uts)
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return 0;
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}
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DM_TEST(dm_test_ofnode_livetree_writing,
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UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
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UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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static int dm_test_ofnode_u32(struct unit_test_state *uts)
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{
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@ -603,18 +599,13 @@ static int dm_test_ofnode_u32(struct unit_test_state *uts)
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return 0;
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}
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DM_TEST(dm_test_ofnode_u32,
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UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
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DM_TEST(dm_test_ofnode_u32, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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static int dm_test_ofnode_add_subnode(struct unit_test_state *uts)
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{
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ofnode node, check, subnode;
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char buf[128];
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/* temporarily disable this test due to a failure fixed later */
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if (!of_live_active())
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return 0;
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node = ofnode_path("/lcd");
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ut_assert(ofnode_valid(node));
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ut_assertok(ofnode_add_subnode(node, "edmund", &subnode));
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@ -677,5 +668,4 @@ static int dm_test_ofnode_add_subnode(struct unit_test_state *uts)
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return 0;
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}
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DM_TEST(dm_test_ofnode_add_subnode,
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UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
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DM_TEST(dm_test_ofnode_add_subnode, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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