18f3d6be6b
Add test cases in test_verifier and test_progs. Negative tests are added in test_verifier as well. The test in test_progs will compare the value of narrower ctx field load result vs. the masked value of normal full-field load result, and will fail if they are not the same. Acked-by: Daniel Borkmann <daniel@iogearbox.net> Signed-off-by: Yonghong Song <yhs@fb.com> Signed-off-by: David S. Miller <davem@davemloft.net>
36 lines
928 B
C
36 lines
928 B
C
/* Copyright (c) 2017 Facebook
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*
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* This program is free software; you can redistribute it and/or
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* modify it under the terms of version 2 of the GNU General Public
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* License as published by the Free Software Foundation.
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*/
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#include <stddef.h>
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#include <string.h>
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#include <linux/bpf.h>
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#include <linux/pkt_cls.h>
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#include "bpf_helpers.h"
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int _version SEC("version") = 1;
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#define TEST_FIELD(TYPE, FIELD, MASK) \
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{ \
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TYPE tmp = *(volatile TYPE *)&skb->FIELD; \
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if (tmp != ((*(volatile __u32 *)&skb->FIELD) & MASK)) \
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return TC_ACT_SHOT; \
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}
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SEC("test1")
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int process(struct __sk_buff *skb)
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{
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TEST_FIELD(__u8, len, 0xFF);
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TEST_FIELD(__u16, len, 0xFFFF);
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TEST_FIELD(__u32, len, 0xFFFFFFFF);
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TEST_FIELD(__u16, protocol, 0xFFFF);
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TEST_FIELD(__u32, protocol, 0xFFFFFFFF);
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TEST_FIELD(__u8, hash, 0xFF);
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TEST_FIELD(__u16, hash, 0xFFFF);
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TEST_FIELD(__u32, hash, 0xFFFFFFFF);
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return TC_ACT_OK;
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}
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