forked from Minki/linux
2a6a28e792
I always go nuts when I start an MTD test on a slow device and have to wait forever until it finishes. From the debug output I already know what the issue is but I have to wait or reset the board hard. Resetting is often not an option (remote access, you don't want lose the current state, etc...). The solution is easy, check for pending signals at key positions in the code. Using that one can even stop a test by pressing CTRL-C as insmod/modprobe have SIGINT pending. Signed-off-by: Richard Weinberger <richard@nod.at> Signed-off-by: Brian Norris <computersforpeace@gmail.com>
254 lines
5.6 KiB
C
254 lines
5.6 KiB
C
/*
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* Copyright (C) 2006-2008 Nokia Corporation
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*
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* This program is free software; you can redistribute it and/or modify it
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* under the terms of the GNU General Public License version 2 as published by
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* the Free Software Foundation.
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*
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* This program is distributed in the hope that it will be useful, but WITHOUT
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* ANY WARRANTY; without even the implied warranty of MERCHANTABILITY or
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* FITNESS FOR A PARTICULAR PURPOSE. See the GNU General Public License for
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* more details.
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*
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* You should have received a copy of the GNU General Public License along with
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* this program; see the file COPYING. If not, write to the Free Software
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* Foundation, 59 Temple Place - Suite 330, Boston, MA 02111-1307, USA.
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*
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* Test random reads, writes and erases on MTD device.
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*
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* Author: Adrian Hunter <ext-adrian.hunter@nokia.com>
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*/
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#define pr_fmt(fmt) KBUILD_MODNAME ": " fmt
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#include <linux/init.h>
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#include <linux/module.h>
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#include <linux/moduleparam.h>
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#include <linux/err.h>
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#include <linux/mtd/mtd.h>
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#include <linux/slab.h>
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#include <linux/sched.h>
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#include <linux/vmalloc.h>
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#include <linux/random.h>
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#include "mtd_test.h"
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static int dev = -EINVAL;
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module_param(dev, int, S_IRUGO);
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MODULE_PARM_DESC(dev, "MTD device number to use");
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static int count = 10000;
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module_param(count, int, S_IRUGO);
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MODULE_PARM_DESC(count, "Number of operations to do (default is 10000)");
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static struct mtd_info *mtd;
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static unsigned char *writebuf;
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static unsigned char *readbuf;
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static unsigned char *bbt;
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static int *offsets;
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static int pgsize;
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static int bufsize;
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static int ebcnt;
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static int pgcnt;
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static int rand_eb(void)
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{
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unsigned int eb;
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again:
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eb = prandom_u32();
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/* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */
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eb %= (ebcnt - 1);
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if (bbt[eb])
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goto again;
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return eb;
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}
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static int rand_offs(void)
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{
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unsigned int offs;
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offs = prandom_u32();
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offs %= bufsize;
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return offs;
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}
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static int rand_len(int offs)
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{
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unsigned int len;
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len = prandom_u32();
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len %= (bufsize - offs);
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return len;
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}
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static int do_read(void)
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{
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int eb = rand_eb();
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int offs = rand_offs();
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int len = rand_len(offs);
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loff_t addr;
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if (bbt[eb + 1]) {
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if (offs >= mtd->erasesize)
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offs -= mtd->erasesize;
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if (offs + len > mtd->erasesize)
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len = mtd->erasesize - offs;
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}
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addr = (loff_t)eb * mtd->erasesize + offs;
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return mtdtest_read(mtd, addr, len, readbuf);
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}
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static int do_write(void)
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{
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int eb = rand_eb(), offs, err, len;
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loff_t addr;
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offs = offsets[eb];
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if (offs >= mtd->erasesize) {
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err = mtdtest_erase_eraseblock(mtd, eb);
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if (err)
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return err;
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offs = offsets[eb] = 0;
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}
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len = rand_len(offs);
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len = ((len + pgsize - 1) / pgsize) * pgsize;
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if (offs + len > mtd->erasesize) {
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if (bbt[eb + 1])
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len = mtd->erasesize - offs;
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else {
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err = mtdtest_erase_eraseblock(mtd, eb + 1);
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if (err)
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return err;
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offsets[eb + 1] = 0;
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}
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}
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addr = (loff_t)eb * mtd->erasesize + offs;
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err = mtdtest_write(mtd, addr, len, writebuf);
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if (unlikely(err))
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return err;
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offs += len;
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while (offs > mtd->erasesize) {
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offsets[eb++] = mtd->erasesize;
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offs -= mtd->erasesize;
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}
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offsets[eb] = offs;
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return 0;
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}
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static int do_operation(void)
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{
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if (prandom_u32() & 1)
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return do_read();
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else
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return do_write();
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}
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static int __init mtd_stresstest_init(void)
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{
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int err;
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int i, op;
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uint64_t tmp;
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printk(KERN_INFO "\n");
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printk(KERN_INFO "=================================================\n");
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if (dev < 0) {
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pr_info("Please specify a valid mtd-device via module parameter\n");
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pr_crit("CAREFUL: This test wipes all data on the specified MTD device!\n");
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return -EINVAL;
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}
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pr_info("MTD device: %d\n", dev);
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mtd = get_mtd_device(NULL, dev);
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if (IS_ERR(mtd)) {
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err = PTR_ERR(mtd);
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pr_err("error: cannot get MTD device\n");
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return err;
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}
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if (mtd->writesize == 1) {
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pr_info("not NAND flash, assume page size is 512 "
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"bytes.\n");
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pgsize = 512;
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} else
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pgsize = mtd->writesize;
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tmp = mtd->size;
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do_div(tmp, mtd->erasesize);
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ebcnt = tmp;
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pgcnt = mtd->erasesize / pgsize;
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pr_info("MTD device size %llu, eraseblock size %u, "
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"page size %u, count of eraseblocks %u, pages per "
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"eraseblock %u, OOB size %u\n",
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(unsigned long long)mtd->size, mtd->erasesize,
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pgsize, ebcnt, pgcnt, mtd->oobsize);
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if (ebcnt < 2) {
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pr_err("error: need at least 2 eraseblocks\n");
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err = -ENOSPC;
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goto out_put_mtd;
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}
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/* Read or write up 2 eraseblocks at a time */
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bufsize = mtd->erasesize * 2;
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err = -ENOMEM;
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readbuf = vmalloc(bufsize);
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writebuf = vmalloc(bufsize);
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offsets = kmalloc(ebcnt * sizeof(int), GFP_KERNEL);
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if (!readbuf || !writebuf || !offsets)
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goto out;
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for (i = 0; i < ebcnt; i++)
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offsets[i] = mtd->erasesize;
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prandom_bytes(writebuf, bufsize);
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bbt = kzalloc(ebcnt, GFP_KERNEL);
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if (!bbt)
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goto out;
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err = mtdtest_scan_for_bad_eraseblocks(mtd, bbt, 0, ebcnt);
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if (err)
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goto out;
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/* Do operations */
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pr_info("doing operations\n");
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for (op = 0; op < count; op++) {
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if ((op & 1023) == 0)
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pr_info("%d operations done\n", op);
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err = do_operation();
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if (err)
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goto out;
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err = mtdtest_relax();
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if (err)
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goto out;
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}
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pr_info("finished, %d operations done\n", op);
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out:
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kfree(offsets);
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kfree(bbt);
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vfree(writebuf);
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vfree(readbuf);
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out_put_mtd:
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put_mtd_device(mtd);
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if (err)
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pr_info("error %d occurred\n", err);
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printk(KERN_INFO "=================================================\n");
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return err;
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}
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module_init(mtd_stresstest_init);
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static void __exit mtd_stresstest_exit(void)
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{
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return;
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}
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module_exit(mtd_stresstest_exit);
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MODULE_DESCRIPTION("Stress test module");
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MODULE_AUTHOR("Adrian Hunter");
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MODULE_LICENSE("GPL");
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