The sensor needs a master clock, handle it explictly in the driver.
Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Signed-off-by: Mauro Carvalho Chehab <m.chehab@samsung.com>
The sensor needs two power supplies, VAA and VDD. Require a regulator
for each of them.
Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Signed-off-by: Mauro Carvalho Chehab <m.chehab@samsung.com>
As discussed on the media summit 2013, there is no reason for the width
and height to be signed.
Therefore this patch is an attempt to convert those fields from __s32 to
__u32.
Signed-off-by: Ricardo Ribalda Delgado <ricardo.ribalda@gmail.com>
Acked-by: Sakari Ailus <sakari.ailus@iki.fi> (documentation and smiapp)
Acked-by: Lad, Prabhakar <prabhakar.csengg@gmail.com>
Signed-off-by: Hans Verkuil <hans.verkuil@cisco.com>
Signed-off-by: Mauro Carvalho Chehab <m.chehab@samsung.com>
Using the managed function the kfree() calls can be removed from the
probe error path and the remove handler.
Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Acked-by: Sylwester Nawrocki <s.nawrocki@samsung.com>
Acked-by: Lad, Prabhakar <prabhakar.csengg@gmail.com>
Acked-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com>
Reviewed-by: Benoît Thébaudeau <benoit.thebaudeau@advansee.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
V4L2_CID_TEST_PATTERN is now a standard control.
This patch replaces the user defined control for test
pattern to make use of standard control V4L2_CID_TEST_PATTERN.
Signed-off-by: Lad, Prabhakar <prabhakar.lad@ti.com>
Signed-off-by: Manjunath Hadli <manjunath.hadli@ti.com>
Acked-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Acked-by: Sakari Ailus <sakari.ailus@iki.fi>
Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
