RAW writes were broken by 782ce79a45
which introduced a check of ops->ooboffs in nand_do_write_ops().
When writing in RAW mode this is called with an ops struct on the stack
of mtdchar.c:mtd_write() which does not initialise ops->ooboffs, so it
is garbage and fails this test.
This test does not make sense if ops->oobbuf is NULL, which it is in the
RAW write path, so include that in the test.
Signed-off-by: Jon Povey <jon.povey@racelogic.co.uk>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Not all the NAND devices have all the information in additional
id bytes.
So add a hook in the nand_chip{} is a good method to calculate the
right value of oobsize, erasesize and so on.
Without the hook,you will get the wrong value, and you have to hack
in the ->scan_bbt() to change the wrong value which make the code
mess.
Signed-off-by: Huang Shijie <shijie8@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently MTD caches the last read NAND page, even if there was an uncorrectable ECC
error. This patch prevents caching in case of uncorrectable ECC errors. The reason
is that we want to allow the user to re-read the NAND page several times. In case of
unstable bits re-trying may help.
Moreover, current behavior is wrong because the first read returns -EBADMSG (correctly)
but the second read succeeds and incorrectly returns 0 (because we read from the cache).
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Only 3 warnings are left, one is off by one character, but splitting the line
would reduce the readability. One is for a for loop statement, which would also
not improve readability. The last one is a false positive on a test.
Artem: it is much easier to verify patches against nand_base.c with
checkpatch.pl when nand_base.c itself does not have so many
checkpatch.pl warnings.
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Artem: it is much easier to verify patches against nand_base.c with
checkpatch.pl when nand_base.c itself does not have so many
checkpatch.pl warnings.
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
In order to reduce the indentation and improve the readability of nand_get_
flash_type, split the ONFI detection logic to its own function. The detection
logic inside nand_flash_detect_onfi is also rewritten to allow for less
indentation.
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch adds support for reading NAND device ONFI parameters and use
the ONFI informations to define its geometry. In case the device supports
ONFI, the onfi_version field in struct nand_chip contains the version (BCD)
and the onfi_params structure can be used by drivers to set up timings and
such. We currently only support ONFI 1.0 parameters.
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Matthieu Castet <matthieu.castet@parrot.com>
Signed-off-by: Maxime Bizon <mbizon@freebox.fr>
Signed-off-by: Florian Fainelli <ffainelli@freebox.fr>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
There are some additions to the detection scheme used by Samsung
MLC NAND. These simple changes to support the 400- and 436-byte OOB
are found in the following data sheet:
Samsung K9GBG08U0M (p.40)
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Toshiba does not use ONFI for their NAND flash. So we have to continue
to add new IDs used by Toshiba devices as well as heuristic detection
for scanning the 2nd page for a BBM. This is a relatively harmless
start at supporting many of them.
These chips mostly follow the same ID fields of previous generations,
but there is a need for a tweak.
These chips introduce a strange 576 byte OOB (that's 36 bytes per
512 bytes of page). In the preliminary data, Toshiba has not
defined exactly how their ID strings should decode. In the future,
a new tweak must be added.
Data is taken from, among others, Toshiba TC58TxG4S2FBAxx
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Some Spansion chips have a method for determining eraseblock size that
is incompatible with similar ID chips of other sizes. This implements
some heuristic detection of these differences.
This patch checks for a 5-byte ID with trailing zeros as well as a
512-byte page size to ensure that chips are not misdetected as the
S30MLxxxP ORNAND series.
[Tweaked by Artem a bit]
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Drivers may (and do) return negative errno values other than -1 from the
ecc.correct callback.
Signed-off-by: Baruch Siach <baruch@tkos.co.il>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Apparently, the check for a 6-byte ID string introduced by commit
426c457a32 ("mtd: nand: extend NAND flash
detection to new MLC chips") is NOT sufficient to determine whether or
not a Samsung chip uses their new MLC detection scheme or the old,
standard scheme. This adds a condition to check cell type.
Signed-off-by: Tilman Sauerbeck <tilman@code-monkey.de>
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Cc: stable@kernel.org
Commit c7b28e25cb ("mtd: nand: refactor BB
marker detection") caused a regression in detection of factory-set bad
block markers, especially for certain small-page NAND. This fix removes
some unneeded constraints on using NAND_SMALL_BADBLOCK_POS, making the
detection code more correct.
This regression can be seen, for example, in Hynix HY27US081G1M and
similar.
Signed-off-by: Brian Norris <norris@broadcom.com>
Tested-by: Michael Guntsche <mike@it-loops.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Fix mtd/nand_base.c kernel-doc warnings and typos.
Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'mtd'
Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'ofs'
Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'len'
Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'invert'
Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'mtd'
Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'ofs'
Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'len'
Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'mtd'
Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'ofs'
Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'len'
Warning(drivers/mtd/nand/nand_base.c:2087): No description found for parameter 'len'
Signed-off-by: Randy Dunlap <randy.dunlap@oracle.com>
Cc: David Woodhouse <dwmw2@infradead.org>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
This is an update that depends on the previous patches I sent.
We can now write to all the appropriate BB marker locations (i.e.
pages 1 AND 2, bytes 1 AND 6) with nand_default_block_markbad() if
necessary, according to the flags marked in chip->options.
Note that I removed the line:
ofs += mtd->oobsize;
Unless I am wrong, this line was completely unnecessary in the
first place.
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This is a revision to PATCH 2/2 that I sent. Link:
http://lists.infradead.org/pipermail/linux-mtd/2010-July/030911.html
Added new flag for scanning of both bytes 1 and 6 of the OOB for
a BB marker (instead of simply one or the other).
The "check_pattern" and "check_short_pattern" functions were updated
to include support for scanning the two different locations in the OOB.
In order to handle increases in variety of necessary scanning patterns,
I implemented dynamic memory allocation of nand_bbt_descr structs
in new function 'nand_create_default_bbt_descr()'. This replaces
some increasingly-unwieldy, statically-declared descriptors. It can
replace several more (e.g. "flashbased" structs). However, I do not
test the flashbased options personally.
How this was tested:
I referenced 30+ data sheets (covering 100+ parts), and I tested a
selection of 10 different chips to varying degrees. Particularly, I
tested the creation of bad-block descriptors and basic BB scanning on
three parts:
ST NAND04GW3B2D, 2K page
ST NAND128W3A, 512B page
Samsung K9F1G08U0A, 2K page
To test these, I wrote some fake bad block markers to the flash (in OOB
bytes 1, 6, and elsewhere) to see if the scanning routine would detect
them properly. However, this method was somewhat limited because the
driver I am using has some bugs in its OOB write functionality.
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Some level of support for various scanning locations was already built in,
but this required clean-up. First, BB marker location cannot be determined
_only_ by the page size. Instead, I implemented some heuristic detection
based on data sheets from various manufacturers (all found in
nand_base.c:nand_get_flash_type()).
Second, once these options were identified, they were not handled properly
by nand_bbt.c:nand_default_bbt(). I updated the static nand_bbt_desc structs
to reflect the need for more combinations of detection. The memory allocation
here probably needs to be done dynamically in the very near future (see next
patches).
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
NAND_BB_LAST_PAGE used to be in nand.h, but it pertained to bad block
management and so belongs next to NAND_BBT_SCAN2NDPAGE in bbm.h. Also,
its previous flag value (0x00000400) conflicted with NAND_BBT_SCANALLPAGES
so I changed its value to 0x00008000. All uses of the name were modified to
provide consistency with other "NAND_BBT_*" flags.
Signed-off-by: Brian Norris <norris@broadcom.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This is a slightly modified version of a patch submitted last year by
Reuben Dowle <reuben.dowle@navico.com>. His original comments follow:
This patch adds support for some MLC NAND flashes that place the BB
marker in the LAST page of the bad block rather than the FIRST page used
for SLC NAND and other types of MLC nand.
Lifted from Samsung datasheet for K9LG8G08U0A (1Gbyte MLC NAND):
"
Identifying Initial Invalid Block(s)
All device locations are erased(FFh) except locations where the initial
invalid block(s) information is written prior to shipping. The initial
invalid block(s) status is defined by the 1st byte in the spare area.
Samsung makes sure that the last page of every initial invalid block has
non-FFh data at the column address of 2,048.
...
"
As far as I can tell, this is the same for all Samsung MLC nand, and in
fact the samsung bsp for the processor used in our project (s3c6410)
actually contained a hack similar to this patch but less portable to
enable use of their NAND parts. I discovered this problem when trying to
use a Micron NAND which does not used this layout - I wish samsung would
put their stuff in main-line to avoid this type of problem.
Currently this patch causes all MLC nand with manufacturer codes from
Samsung and ST(Numonyx) to use this alternative location, since these
are the manufactures that I know of that use this layout.
Signed-off-by: Kevin Cernekee <cernekee@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Some of the newer MLC devices have a 6-byte ID sequence in which
several field definitions differ from older chips in a manner that is
not backward compatible. For instance:
Samsung K9GAG08U0M (5-byte sequence): ec d5 14 b6 74
4th byte, bits 1:0 encode the page size: 0=1KiB, 1=2KiB, 2=4KiB, 3=8KiB
4th byte, bits 5:4 encode the block size: 0=64KiB, 1=128KiB, ...
4th byte, bit 6 encodes the OOB size: 0=8B/512B, 1=16B/512B
Samsung K9GAG08U0D (6-byte sequence): ec d5 94 29 34 41
4th byte, bits 1:0 encode the page size: 0=2KiB, 1=4KiB, 3=8KiB, 4=rsvd
4th byte, bits 7;5:4 encode the block size: 0=128KiB, 1=256KiB, ...
4th byte, bits 6;3:2 encode the OOB size: 1=128B/page, 2=218B/page
This patch uses the new 6-byte scheme if the following conditions are
all true:
1) The ID code wraps around after exactly 6 bytes
2) Manufacturer is Samsung
3) 6th byte is zero
The patch also extends the maximum OOB size from 128B to 256B.
Signed-off-by: Kevin Cernekee <cernekee@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This can be used to protect against bitflips in that field, but now mostly
for smartmedia.
Signed-off-by: Maxim Levitsky <maximlevitsky@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This changes the behavier of MTD_OOB_RAW. It used to read both OOB and
data to the data buffer, however you would still need to specify the
dummy oob buffer.
This is only used in one place, but makes it hard to read data+oob
without ECC test, thus I removed that behavier, and fixed the user.
Now MTD_OOB_RAW behaves just like MTD_OOB_PLACE, but doesn't do ECC
validation
Signed-off-by: Maxim Levitsky <maximlevitsky@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
nand_do_write_ops was broken in regard to writing several pages, each
with its own oob.
Although nand_do_write_ops intends to allow such mode, it fails do do so
Probably this was never tested.
Also add missing checks for attempts to write at illegal offsets.
Signed-off-by: Maxim Levitsky <maximlevitsky@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
MTD_OOB_PLACE is supposed to read/write the raw oob data similiar to the
MTD_OOB_RAW however due to a bug, currently it is not possible to read
more data that is specified by the oob 'free' regions.
Signed-off-by: Maxim Levitsky <maximlevitsky@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Since all userspace threads are frozen at the time the nand_suspend is called,
they aren't inside any nand function.
We don't call try_to_freeze in nand ether. Thus the only user that can
be inside the nand functions is an non freezeable kernel thread. Thus we
can safely wait for it to finish.
Signed-off-by: Maxim Levitsky <maximlevitsky@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Add nand lock / unlock routines. At least 'micron' parts
support this.
Signed-off-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
... verification for 'nand_erase_nand'
These checks are expected to be used by 'nand_lock' and 'nand_unlock'
routines too. As all these three are block aligned operations.
So, creating a helper function for this makes sense.
Signed-off-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Symptom:
device_suspend(): mtd_cls_suspend+0x0/0x58 returns -11
PM: Device mtd14 failed to suspend: error -11
PM: Some devices failed to suspend
This patch enables other chips to be suspended if the active chip of
the controller has been suspended.
Signed-off-by: Jin Qing <b24347@freescale.com>
Signed-off-by: Li Yang <leoli@freescale.com>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Add NAND_SCAN_SILENT_NODEV to chip->options to the user-worrying messages
'No NAND device found!!!'. This message often worries users (was three
exclamation marks really necessary?) and especially in systems such as the
Simtec Osiris where there may be optional NAND devices which are not
known until probe time.
Revised version of the original NAND_PROBE_SPECULATIVE patch after comments
by Artem Bityutskiy about adding a whole new call.
Signed-off-by: Ben Dooks <ben@simtec.co.uk>
Signed-off-by: Simtec Linux Team <linux@simtec.co.uk>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This is a quick and dirty patch to add panic_write for NAND flashes. The
patch seems to work OK on my CRIS board running a 2.6.26 kernel with a
ID: 0x20, Chip ID: 0xf1 (ST Micro NAND 128MiB 3,3V 8-bit), and also on a
OpenRD base (Marvell Kirkwood) board with a Toshiba NAND 512MiB 3,3V
8-bit flash with 2.6.32-pre1.
Signed-off-by: Edgar E. Iglesias <edgar@axis.com>
Signed-off-by: Simon Kagstrom <simon.kagstrom@netinsight.net>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Fixed following htmldocs warnings:
DOCPROC Documentation/DocBook/mtdnand.xml
Warning(drivers/mtd/nand/nand_base.c:769): No description found for parameter 'page'
Warning(drivers/mtd/nand/nand_base.c:785): No description found for parameter 'page'
Warning(drivers/mtd/nand/nand_base.c:824): No description found for parameter 'page'
Warning(drivers/mtd/nand/nand_base.c:947): No description found for parameter 'page'
Warning(drivers/mtd/nand/nand_base.c:996): No description found for parameter 'page'
Warning(drivers/mtd/nand/nand_base.c:1040): No description found for parameter 'page'
Signed-off-by: Jaswinder Singh Rajput <jaswinderrajput@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch adds the new mode NAND_ECC_HW_OOB_FIRST in the nand code to
support 4-bit ECC on TI DaVinci devices with large page (up to 2KiB) NAND
chips. This ECC mode is similar to NAND_ECC_HW, with the exception of
read_page API that first reads the OOB area, reads the data in chunks,
feeds the ECC from OOB area to the ECC hw engine and perform any
correction on the data as per the ECC status reported by the engine.
"ECC_HW_OOB_FIRST" name suggested by Thomas Gleixner
Reviewed-by: David Brownell <dbrownell@users.sourceforge.net>
Signed-off-by: Sneha Narnakaje <nsnehaprabha@ti.com>
Signed-off-by: Sandeep Paulraj <s-paulraj@ti.com>
Cc: Thomas Gleixner <tglx@linutronix.de>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This patch adds a new "page" parameter to all NAND read_page/read_page_raw
APIs. The read_page API for the new mode ECC_HW_OOB_FIRST requires the
page information to send the READOOB command and read the OOB area before
the data area.
Reviewed-by: David Brownell <dbrownell@users.sourceforge.net>
Signed-off-by: Sneha Narnakaje <nsnehaprabha@ti.com>
Signed-off-by: Sandeep Paulraj <s-paulraj@ti.com>
Cc: Thomas Gleixner <tglx@linutronix.de>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Correcting debug prints by removing function names from print messages
and using '__func__' macro instead.
Function names were wrong in few places.
Signed-off-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Resolve issue noted by Sneha: when computing oobavail from
the list of free areas in the OOB, don't assume there will
always be an unused slot at the end. With ECC_HW_SYNDROME
and 4KiB page chips, it's fairly likely there *won't* be one.
Signed-off-by: David Brownell <dbrownell@users.sourceforge.net>
Cc: "Narnakaje, Snehaprabha" <nsnehaprabha@ti.com>"
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* git://git.infradead.org/mtd-2.6: (53 commits)
[MTD] struct device - replace bus_id with dev_name(), dev_set_name()
[MTD] [NOR] Fixup for Numonyx M29W128 chips
[MTD] mtdpart: Make ecc_stats more realistic.
powerpc/85xx: TQM8548: Update DTS file for multi-chip support
powerpc: NAND: FSL UPM: document new bindings
[MTD] [NAND] FSL-UPM: Add wait flags to support board/chip specific delays
[MTD] [NAND] FSL-UPM: add multi chip support
[MTD] [NOR] Add device parent info to physmap_of
[MTD] [NAND] Add support for NAND on the Socrates board
[MTD] [NAND] Add support for 4KiB pages.
[MTD] sysfs support should not depend on CONFIG_PROC_FS
[MTD] [NAND] Add parent info for CAFÉ controller
[MTD] support driver model updates
[MTD] driver model updates (part 2)
[MTD] driver model updates
[MTD] [NAND] move gen_nand's probe function to .devinit.text
[MTD] [MAPS] move sa1100 flash's probe function to .devinit.text
[MTD] fix use after free in register_mtd_blktrans
[MTD] [MAPS] Drop now unused sharpsl-flash map
[MTD] ofpart: Check name property to determine partition nodes.
...
Manually fix trivial conflict in drivers/mtd/maps/Makefile
Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
Signed-off-by: Sebastian Siewior <bigeasy@linutronix.de>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Impact: Replace and remove risky (non-EXPORTed) API
module_text_address() returns a pointer to the module, which given locking
improvements in module.c, is useless except to test for NULL:
1) If the module can't go away, use __module_text_address.
2) Otherwise, just use is_module_text_address().
Cc: linux-mtd@lists.infradead.org
Signed-off-by: Rusty Russell <rusty@rustcorp.com.au>
Fix incorrect debug messages (*write* not read); someone committed some
cut'n'paste bugs. There might be more, I only noticed these since I was
looking for nand_read usage and landed in some very wrong functions.
IMO all MTD debugging message framework is goofed, anyway. It uses
"DEBUG" in a way that's incompatible with usage most everywhere else in
the kernel, and which prevents normal pr_dbg() and dev_dbg() calls from
working right.
[True. It predates those by a long way, and should probably be updated
to use them. dwmw2]
Signed-off-by: David Brownell <dbrownell@users.sourceforge.net>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
The syndrome based page read/write routines store ECC, and possibly other
"OOB" data, right after each chunk of ECC'd data. With ECC chunk size of
512 bytes and a large page (2KiB) NAND, the layout is:
data-0 OOB-0 data-1 OOB-1 data-2 OOB-2 data-3 OOB-3 OOB-leftover
Where OOBx is (prepad, ECC, postpad). However, the current "raw" routines
use a traditional layout -- data OOB, disregarding the prepad and postpad
values -- so when they're used with that type of ECC hardware, those calls
mix up the data and OOB. Which means, in particular, that bad block
tables won't be found on startup, with data corruption and related chaos
ensuing.
The current syndrome-based drivers in mainline all seem to use one chunk
per page; presumably they haven't noticed such bugs.
Fix this, by adding read/write page_raw_syndrome() routines as siblings of
the existing non-raw routines; "raw" just means to bypass the ECC
computations, not change data and OOB layout.
Signed-off-by: David Brownell <dbrownell@users.sourceforge.net>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Delete extra kernel-doc notation for struct fields and function
parameters that don't exist:
Warning(include/linux/mtd/nand.h:428): Excess struct/union/enum/typedef member 'wq' description in 'nand_chip'
Warning(include/linux/mtd/nand.h:428): Excess struct/union/enum/typedef member 'datbuf' description in 'nand_chip'
Warning(include/linux/mtd/nand.h:428): Excess struct/union/enum/typedef member 'oobbuf' description in 'nand_chip'
Warning(include/linux/mtd/nand.h:428): Excess struct/union/enum/typedef member 'oobdirty' description in 'nand_chip'
Warning(include/linux/mtd/nand.h:428): Excess struct/union/enum/typedef member 'data_poi' description in 'nand_chip'
Warning(drivers/mtd/nand/nand_base.c:2527): Excess function parameter 'maxchips' description in 'nand_scan_tail'
Signed-off-by: Randy Dunlap <randy.dunlap@oracle.com>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
MTD internal API presently uses 32-bit values to represent
device size. This patch updates them to 64-bits but leaves
the external API unchanged. Extending the external API
is a separate issue for several reasons. First, no one
needs it at the moment. Secondly, whether the implementation
is done with IOCTLs, sysfs or both is still debated. Thirdly
external API changes require the internal API to be accepted
first.
Note that although the MTD API will be able to support 64-bit
device sizes, existing drivers do not and are not required
to do so, although NAND base has been updated.
In general, changing from 32-bit to 64-bit values cause little
or no changes to the majority of the code with the following
exceptions:
- printk message formats
- division and modulus of 64-bit values
- NAND base support
- 32-bit local variables used by mtdpart and mtdconcat
- naughtily assuming one structure maps to another
in MEMERASE ioctl
Signed-off-by: Adrian Hunter <ext-adrian.hunter@nokia.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Some chips require a RESET after power-up (e.g. Micron MT29FxGxxxxx).
The first command sent is NAND_CMD_READID.
Issue a NAND_CMD_RESET in nand_scan_ident before reading the device id.
Tested with an MT29F4G08AAC.
Signed-off-by: Karl Beldan <karl.beldan@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
