There are only two requests for uac2, it may not be enough at high
loading system which usb interrupt handler can't be serviced on
time, then the data will be lost since it is isoc transfer for audio.
In this patch, we introduce a parameter for the number for usb request,
and the user can override it if current number for request is not enough
for his/her use case.
Besides, update this parameter for legacy audio gadget and documentation.
Signed-off-by: Peter Chen <peter.chen@nxp.com>
Signed-off-by: Felipe Balbi <felipe.balbi@linux.intel.com>
It seems that gitorious repository is no longer accessible, so we
replace it with address to active repository.
Signed-off-by: Robert Baldyga <r.baldyga@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Add both bulk and iso depth of queue for sourcesink.
Reviewed-by: Krzysztof Opasiak <k.opasiak@samsung.com>
Signed-off-by: Peter Chen <peter.chen@freescale.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
testusb.c at http://www.linux-usb.org/usbtest/ is out of date,
using the one at the kernel source folder.
Cc: <stable@vger.kernel.org>
Signed-off-by: Peter Chen <peter.chen@freescale.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
RNDIS function has a limitation on the number of allowed instances.
So far it has been RNDIS_MAX_CONFIGS, which happens to be one.
In order to eliminate this kind of arbitrary limitation we should not
preallocate a predefined (RNDIS_MAX_CONFIGS) array of struct rndis_params
instances but instead allow allocating them on demand.
This patch allocates struct rndis_params on demand in rndis_register().
Coversly, the structure is free()'d in rndis_deregister().
If CONFIG_USB_GADGET_DEBUG_FILES is set, the proc files are created which
is the same behaviour as before, but the moment of creation is delayed
until struct rndis_params is actually allocated.
rnids_init() and rndis_exit() have nothing to do, so they are eliminated.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Add support for configfs interface so that f_printer can be used as a
component of usb gadgets composed with it.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UVC function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UAC2 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UAC1 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SOURCESINK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SERIAL function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test RNDIS function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test PHONET function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test OBEX function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test NCM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MIDI function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MASS STORAGE function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test LOOPBACK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test HID function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test FFS (FunctionFS) function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test EEM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM subset function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
The newly added file will be used to provide descriptions of how to test
the functions of USB gadgets.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
