linux/Documentation/ABI/testing/sysfs-bus-iio

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What: /sys/bus/iio/devices/iio:deviceX
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Hardware chip or device accessed by one communication port.
Corresponds to a grouping of sensor channels. X is the IIO
index of the device.
What: /sys/bus/iio/devices/triggerX
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
An event driven driver of data capture to an in kernel buffer.
May be provided by a device driver that also has an IIO device
based on hardware generated events (e.g. data ready) or
provided by a separate driver for other hardware (e.g.
periodic timer, GPIO or high resolution timer).
Contains trigger type specific elements. These do not
generalize well and hence are not documented in this file.
X is the IIO index of the trigger.
What: /sys/bus/iio/devices/iio:deviceX/buffer
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Directory of attributes relating to the buffer for the device.
What: /sys/bus/iio/devices/iio:deviceX/name
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Description of the physical chip / device for device X.
Typically a part number.
What: /sys/bus/iio/devices/iio:deviceX/sampling_frequency
What: /sys/bus/iio/devices/iio:deviceX/buffer/sampling_frequency
What: /sys/bus/iio/devices/triggerX/sampling_frequency
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Some devices have internal clocks. This parameter sets the
resulting sampling frequency. In many devices this
parameter has an effect on input filters etc. rather than
simply controlling when the input is sampled. As this
effects data ready triggers, hardware buffers and the sysfs
direct access interfaces, it may be found in any of the
relevant directories. If it effects all of the above
then it is to be found in the base device directory.
What: /sys/bus/iio/devices/iio:deviceX/sampling_frequency_available
What: /sys/.../iio:deviceX/buffer/sampling_frequency_available
What: /sys/bus/iio/devices/triggerX/sampling_frequency_available
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
When the internal sampling clock can only take a small
discrete set of values, this file lists those available.
What: /sys/bus/iio/devices/iio:deviceX/oversampling_ratio
KernelVersion: 2.6.38
Contact: linux-iio@vger.kernel.org
Description:
Hardware dependent ADC oversampling. Controls the sampling ratio
of the digital filter if available.
What: /sys/bus/iio/devices/iio:deviceX/oversampling_ratio_available
KernelVersion: 2.6.38
Contact: linux-iio@vger.kernel.org
Description:
Hardware dependent values supported by the oversampling filter.
What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_raw
What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_supply_raw
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Raw (unscaled no bias removal etc.) voltage measurement from
channel Y. In special cases where the channel does not
correspond to externally available input one of the named
versions may be used. The number must always be specified and
unique to allow association with event codes. Units after
application of scale and offset are millivolts.
What: /sys/bus/iio/devices/iio:deviceX/in_voltageY-voltageZ_raw
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Raw (unscaled) differential voltage measurement equivalent to
channel Y - channel Z where these channel numbers apply to the
physically equivalent inputs when non differential readings are
separately available. In differential only parts, then all that
is required is a consistent labeling. Units after application
of scale and offset are millivolts.
What: /sys/bus/iio/devices/iio:deviceX/in_capacitanceY_raw
KernelVersion: 3.2
Contact: linux-iio@vger.kernel.org
Description:
Raw capacitance measurement from channel Y. Units after
application of scale and offset are nanofarads.
What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
KernelVersion: 3.2
Contact: linux-iio@vger.kernel.org
Description:
Raw differential capacitance measurement equivalent to
channel Y - channel Z where these channel numbers apply to the
physically equivalent inputs when non differential readings are
separately available. In differential only parts, then all that
is required is a consistent labeling. Units after application
of scale and offset are nanofarads.
What: /sys/bus/iio/devices/iio:deviceX/in_temp_raw
What: /sys/bus/iio/devices/iio:deviceX/in_tempX_raw
What: /sys/bus/iio/devices/iio:deviceX/in_temp_x_raw
What: /sys/bus/iio/devices/iio:deviceX/in_temp_y_raw
What: /sys/bus/iio/devices/iio:deviceX/in_temp_ambient_raw
What: /sys/bus/iio/devices/iio:deviceX/in_temp_object_raw
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Raw (unscaled no bias removal etc.) temperature measurement.
If an axis is specified it generally means that the temperature
sensor is associated with one part of a compound device (e.g.
a gyroscope axis). The ambient and object modifiers distinguish
between ambient (reference) and distant temperature for contact-
less measurements. Units after application of scale and offset
are milli degrees Celsius.
What: /sys/bus/iio/devices/iio:deviceX/in_tempX_input
KernelVersion: 2.6.38
Contact: linux-iio@vger.kernel.org
Description:
Scaled temperature measurement in milli degrees Celsius.
What: /sys/bus/iio/devices/iio:deviceX/in_accel_x_raw
What: /sys/bus/iio/devices/iio:deviceX/in_accel_y_raw
What: /sys/bus/iio/devices/iio:deviceX/in_accel_z_raw
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Acceleration in direction x, y or z (may be arbitrarily assigned
but should match other such assignments on device).
Has all of the equivalent parameters as per voltageY. Units
after application of scale and offset are m/s^2.
What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_x_raw
What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_y_raw
What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_z_raw
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Angular velocity about axis x, y or z (may be arbitrarily
assigned). Has all the equivalent parameters as per voltageY.
Units after application of scale and offset are radians per
second.
What: /sys/bus/iio/devices/iio:deviceX/in_incli_x_raw
What: /sys/bus/iio/devices/iio:deviceX/in_incli_y_raw
What: /sys/bus/iio/devices/iio:deviceX/in_incli_z_raw
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Inclination raw reading about axis x, y or z (may be
arbitrarily assigned). Data converted by application of offset
and scale to degrees.
What: /sys/bus/iio/devices/iio:deviceX/in_magn_x_raw
What: /sys/bus/iio/devices/iio:deviceX/in_magn_y_raw
What: /sys/bus/iio/devices/iio:deviceX/in_magn_z_raw
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Magnetic field along axis x, y or z (may be arbitrarily
assigned). Data converted by application of offset
then scale to Gauss.
What: /sys/bus/iio/devices/iio:deviceX/in_accel_x_peak_raw
What: /sys/bus/iio/devices/iio:deviceX/in_accel_y_peak_raw
What: /sys/bus/iio/devices/iio:deviceX/in_accel_z_peak_raw
KernelVersion: 2.6.36
Contact: linux-iio@vger.kernel.org
Description:
Highest value since some reset condition. These
attributes allow access to this and are otherwise
the direct equivalent of the <type>Y[_name]_raw attributes.
What: /sys/bus/iio/devices/iio:deviceX/in_accel_xyz_squared_peak_raw
KernelVersion: 2.6.36
Contact: linux-iio@vger.kernel.org
Description:
A computed peak value based on the sum squared magnitude of
the underlying value in the specified directions.
What: /sys/bus/iio/devices/iio:deviceX/in_pressureY_raw
What: /sys/bus/iio/devices/iio:deviceX/in_pressure_raw
KernelVersion: 3.8
Contact: linux-iio@vger.kernel.org
Description:
Raw pressure measurement from channel Y. Units after
application of scale and offset are kilopascal.
What: /sys/bus/iio/devices/iio:deviceX/in_pressureY_input
What: /sys/bus/iio/devices/iio:deviceX/in_pressure_input
KernelVersion: 3.8
Contact: linux-iio@vger.kernel.org
Description:
Scaled pressure measurement from channel Y, in kilopascal.
What: /sys/bus/iio/devices/iio:deviceX/in_humidityrelative_raw
KernelVersion: 3.14
Contact: linux-iio@vger.kernel.org
Description:
Raw humidity measurement of air. Units after application of
scale and offset are milli percent.
What: /sys/bus/iio/devices/iio:deviceX/in_humidityrelative_input
KernelVersion: 3.14
Contact: linux-iio@vger.kernel.org
Description:
Scaled humidity measurement in milli percent.
What: /sys/bus/iio/devices/iio:deviceX/in_X_mean_raw
KernelVersion: 3.5
Contact: linux-iio@vger.kernel.org
Description:
Averaged raw measurement from channel X. The number of values
used for averaging is device specific. The converting rules for
normal raw values also applies to the averaged raw values.
What: /sys/bus/iio/devices/iio:deviceX/in_accel_offset
What: /sys/bus/iio/devices/iio:deviceX/in_accel_x_offset
What: /sys/bus/iio/devices/iio:deviceX/in_accel_y_offset
What: /sys/bus/iio/devices/iio:deviceX/in_accel_z_offset
What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_offset
What: /sys/bus/iio/devices/iio:deviceX/in_voltage_offset
What: /sys/bus/iio/devices/iio:deviceX/in_tempY_offset
What: /sys/bus/iio/devices/iio:deviceX/in_temp_offset
What: /sys/bus/iio/devices/iio:deviceX/in_pressureY_offset
What: /sys/bus/iio/devices/iio:deviceX/in_pressure_offset
What: /sys/bus/iio/devices/iio:deviceX/in_humidityrelative_offset
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
If known for a device, offset to be added to <type>[Y]_raw prior
to scaling by <type>[Y]_scale in order to obtain value in the
<type> units as specified in <type>[Y]_raw documentation.
Not present if the offset is always 0 or unknown. If Y or
axis <x|y|z> is not present, then the offset applies to all
in channels of <type>.
May be writable if a variable offset can be applied on the
device. Note that this is different to calibbias which
is for devices (or drivers) that apply offsets to compensate
for variation between different instances of the part, typically
adjusted by using some hardware supported calibration procedure.
Calibbias is applied internally, offset is applied in userspace
to the _raw output.
What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_scale
What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_supply_scale
What: /sys/bus/iio/devices/iio:deviceX/in_voltage_scale
What: /sys/bus/iio/devices/iio:deviceX/out_voltageY_scale
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_scale
What: /sys/bus/iio/devices/iio:deviceX/in_accel_scale
What: /sys/bus/iio/devices/iio:deviceX/in_accel_peak_scale
What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_scale
What: /sys/bus/iio/devices/iio:deviceX/in_magn_scale
What: /sys/bus/iio/devices/iio:deviceX/in_magn_x_scale
What: /sys/bus/iio/devices/iio:deviceX/in_magn_y_scale
What: /sys/bus/iio/devices/iio:deviceX/in_magn_z_scale
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_magnetic_scale
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_true_scale
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_magnetic_tilt_comp_scale
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_true_tilt_comp_scale
What: /sys/bus/iio/devices/iio:deviceX/in_pressureY_scale
What: /sys/bus/iio/devices/iio:deviceX/in_pressure_scale
What: /sys/bus/iio/devices/iio:deviceX/in_humidityrelative_scale
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
If known for a device, scale to be applied to <type>Y[_name]_raw
post addition of <type>[Y][_name]_offset in order to obtain the
measured value in <type> units as specified in
<type>[Y][_name]_raw documentation. If shared across all in
channels then Y and <x|y|z> are not present and the value is
called <type>[Y][_name]_scale. The peak modifier means this
value is applied to <type>Y[_name]_peak_raw values.
What: /sys/bus/iio/devices/iio:deviceX/in_accel_x_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_accel_y_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_accel_z_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_x_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_y_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_z_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_illuminance0_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_proximity0_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_pressureY_calibbias
What: /sys/bus/iio/devices/iio:deviceX/in_pressure_calibbias
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Hardware applied calibration offset (assumed to fix production
inaccuracies).
What /sys/bus/iio/devices/iio:deviceX/in_voltageY_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_voltageY_supply_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_voltage_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_accel_x_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_accel_y_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_accel_z_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_anglvel_x_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_anglvel_y_calibscale
What /sys/bus/iio/devices/iio:deviceX/in_anglvel_z_calibscale
what /sys/bus/iio/devices/iio:deviceX/in_illuminance0_calibscale
what /sys/bus/iio/devices/iio:deviceX/in_proximity0_calibscale
What: /sys/bus/iio/devices/iio:deviceX/in_pressureY_calibscale
What: /sys/bus/iio/devices/iio:deviceX/in_pressure_calibscale
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Hardware applied calibration scale factor (assumed to fix
production inaccuracies). If shared across all channels,
<type>_calibscale is used.
What: /sys/bus/iio/devices/iio:deviceX/in_accel_scale_available
What: /sys/.../iio:deviceX/in_voltageX_scale_available
What: /sys/.../iio:deviceX/in_voltage-voltage_scale_available
What: /sys/.../iio:deviceX/out_voltageX_scale_available
What: /sys/.../iio:deviceX/out_altvoltageX_scale_available
What: /sys/.../iio:deviceX/in_capacitance_scale_available
What: /sys/.../iio:deviceX/in_pressure_scale_available
What: /sys/.../iio:deviceX/in_pressureY_scale_available
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
If a discrete set of scale values is available, they
are listed in this attribute.
What /sys/bus/iio/devices/iio:deviceX/out_voltageY_hardwaregain
What: /sys/bus/iio/devices/iio:deviceX/in_intensity_red_hardwaregain
What: /sys/bus/iio/devices/iio:deviceX/in_intensity_green_hardwaregain
What: /sys/bus/iio/devices/iio:deviceX/in_intensity_blue_hardwaregain
What: /sys/bus/iio/devices/iio:deviceX/in_intensity_clear_hardwaregain
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Hardware applied gain factor. If shared across all channels,
<type>_hardwaregain is used.
What: /sys/.../in_accel_filter_low_pass_3db_frequency
What: /sys/.../in_magn_filter_low_pass_3db_frequency
What: /sys/.../in_anglvel_filter_low_pass_3db_frequency
KernelVersion: 3.2
Contact: linux-iio@vger.kernel.org
Description:
If a known or controllable low pass filter is applied
to the underlying data channel, then this parameter
gives the 3dB frequency of the filter in Hz.
What: /sys/bus/iio/devices/iio:deviceX/out_voltageY_raw
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_raw
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Raw (unscaled, no bias etc.) output voltage for
channel Y. The number must always be specified and
unique if the output corresponds to a single channel.
While DAC like devices typically use out_voltage,
a continuous frequency generating device, such as
a DDS or PLL should use out_altvoltage.
What: /sys/bus/iio/devices/iio:deviceX/out_voltageY&Z_raw
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY&Z_raw
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Raw (unscaled, no bias etc.) output voltage for an aggregate of
channel Y, channel Z, etc. This interface is available in cases
where a single output sets the value for multiple channels
simultaneously.
What: /sys/bus/iio/devices/iio:deviceX/out_voltageY_powerdown_mode
What: /sys/bus/iio/devices/iio:deviceX/out_voltage_powerdown_mode
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_powerdown_mode
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltage_powerdown_mode
KernelVersion: 2.6.38
Contact: linux-iio@vger.kernel.org
Description:
Specifies the output powerdown mode.
DAC output stage is disconnected from the amplifier and
1kohm_to_gnd: connected to ground via an 1kOhm resistor,
6kohm_to_gnd: connected to ground via a 6kOhm resistor,
20kohm_to_gnd: connected to ground via a 20kOhm resistor,
100kohm_to_gnd: connected to ground via an 100kOhm resistor,
500kohm_to_gnd: connected to ground via a 500kOhm resistor,
three_state: left floating.
For a list of available output power down options read
outX_powerdown_mode_available. If Y is not present the
mode is shared across all outputs.
What: /sys/.../iio:deviceX/out_votlageY_powerdown_mode_available
What: /sys/.../iio:deviceX/out_voltage_powerdown_mode_available
What: /sys/.../iio:deviceX/out_altvotlageY_powerdown_mode_available
What: /sys/.../iio:deviceX/out_altvoltage_powerdown_mode_available
KernelVersion: 2.6.38
Contact: linux-iio@vger.kernel.org
Description:
Lists all available output power down modes.
If Y is not present the mode is shared across all outputs.
What: /sys/bus/iio/devices/iio:deviceX/out_voltageY_powerdown
What: /sys/bus/iio/devices/iio:deviceX/out_voltage_powerdown
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_powerdown
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltage_powerdown
KernelVersion: 2.6.38
Contact: linux-iio@vger.kernel.org
Description:
Writing 1 causes output Y to enter the power down mode specified
by the corresponding outY_powerdown_mode. DAC output stage is
disconnected from the amplifier. Clearing returns to normal
operation. Y may be suppressed if all outputs are controlled
together.
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_frequency
KernelVersion: 3.4.0
Contact: linux-iio@vger.kernel.org
Description:
Output frequency for channel Y in Hz. The number must always be
specified and unique if the output corresponds to a single
channel.
What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_phase
KernelVersion: 3.4.0
Contact: linux-iio@vger.kernel.org
Description:
Phase in radians of one frequency/clock output Y
(out_altvoltageY) relative to another frequency/clock output
(out_altvoltageZ) of the device X. The number must always be
specified and unique if the output corresponds to a single
channel.
What: /sys/bus/iio/devices/iio:deviceX/events
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Configuration of which hardware generated events are passed up
to user-space.
What: /sys/.../iio:deviceX/events/in_accel_x_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_accel_x_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_accel_y_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_accel_y_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_accel_z_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_accel_z_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_anglvel_x_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_anglvel_x_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_anglvel_y_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_anglvel_y_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_anglvel_z_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_anglvel_z_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_magn_x_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_magn_x_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_magn_y_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_magn_y_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_magn_z_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_magn_z_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_tilt_comp_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_tilt_comp_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_tilt_comp_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_tilt_comp_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_voltageY_supply_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_voltageY_supply_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_voltageY_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_voltageY_thresh_falling_en
What: /sys/.../iio:deviceX/events/in_tempY_thresh_rising_en
What: /sys/.../iio:deviceX/events/in_tempY_thresh_falling_en
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Event generated when channel passes a threshold in the specified
(_rising|_falling) direction. If the direction is not specified,
then either the device will report an event which ever direction
a single threshold value is passed in (e.g.
<type>[Y][_name]_<raw|input>_thresh_value) or
<type>[Y][_name]_<raw|input>_thresh_rising_value and
<type>[Y][_name]_<raw|input>_thresh_falling_value may take
different values, but the device can only enable both thresholds
or neither.
Note the driver will assume the last p events requested are
to be enabled where p is how many it supports (which may vary
depending on the exact set requested. So if you want to be
sure you have set what you think you have, check the contents of
these attributes after everything is configured. Drivers may
have to buffer any parameters so that they are consistent when
a given event type is enabled at a future point (and not those for
whatever event was previously enabled).
What: /sys/.../iio:deviceX/events/in_accel_x_roc_rising_en
What: /sys/.../iio:deviceX/events/in_accel_x_roc_falling_en
What: /sys/.../iio:deviceX/events/in_accel_y_roc_rising_en
What: /sys/.../iio:deviceX/events/in_accel_y_roc_falling_en
What: /sys/.../iio:deviceX/events/in_accel_z_roc_rising_en
What: /sys/.../iio:deviceX/events/in_accel_z_roc_falling_en
What: /sys/.../iio:deviceX/events/in_anglvel_x_roc_rising_en
What: /sys/.../iio:deviceX/events/in_anglvel_x_roc_falling_en
What: /sys/.../iio:deviceX/events/in_anglvel_y_roc_rising_en
What: /sys/.../iio:deviceX/events/in_anglvel_y_roc_falling_en
What: /sys/.../iio:deviceX/events/in_anglvel_z_roc_rising_en
What: /sys/.../iio:deviceX/events/in_anglvel_z_roc_falling_en
What: /sys/.../iio:deviceX/events/in_magn_x_roc_rising_en
What: /sys/.../iio:deviceX/events/in_magn_x_roc_falling_en
What: /sys/.../iio:deviceX/events/in_magn_y_roc_rising_en
What: /sys/.../iio:deviceX/events/in_magn_y_roc_falling_en
What: /sys/.../iio:deviceX/events/in_magn_z_roc_rising_en
What: /sys/.../iio:deviceX/events/in_magn_z_roc_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_roc_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_roc_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_roc_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_roc_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_tilt_comp_roc_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_magnetic_tilt_comp_roc_falling_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_tilt_comp_roc_rising_en
What: /sys/.../iio:deviceX/events/in_rot_from_north_true_tilt_comp_roc_falling_en
What: /sys/.../iio:deviceX/events/in_voltageY_supply_roc_rising_en
What: /sys/.../iio:deviceX/events/in_voltageY_supply_roc_falling_en
What: /sys/.../iio:deviceX/events/in_voltageY_roc_rising_en
What: /sys/.../iio:deviceX/events/in_voltageY_roc_falling_en
What: /sys/.../iio:deviceX/events/in_tempY_roc_rising_en
What: /sys/.../iio:deviceX/events/in_tempY_roc_falling_en
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Event generated when channel passes a threshold on the rate of
change (1st differential) in the specified (_rising|_falling)
direction. If the direction is not specified, then either the
device will report an event which ever direction a single
threshold value is passed in (e.g.
<type>[Y][_name]_<raw|input>_roc_value) or
<type>[Y][_name]_<raw|input>_roc_rising_value and
<type>[Y][_name]_<raw|input>_roc_falling_value may take
different values, but the device can only enable both rate of
change thresholds or neither.
Note the driver will assume the last p events requested are
to be enabled where p is however many it supports (which may
vary depending on the exact set requested. So if you want to be
sure you have set what you think you have, check the contents of
these attributes after everything is configured. Drivers may
have to buffer any parameters so that they are consistent when
a given event type is enabled a future point (and not those for
whatever event was previously enabled).
What: /sys/.../events/in_accel_x_raw_thresh_rising_value
What: /sys/.../events/in_accel_x_raw_thresh_falling_value
What: /sys/.../events/in_accel_y_raw_thresh_rising_value
What: /sys/.../events/in_accel_y_raw_thresh_falling_value
What: /sys/.../events/in_accel_z_raw_thresh_rising_value
What: /sys/.../events/in_accel_z_raw_thresh_falling_value
What: /sys/.../events/in_anglvel_x_raw_thresh_rising_value
What: /sys/.../events/in_anglvel_x_raw_thresh_falling_value
What: /sys/.../events/in_anglvel_y_raw_thresh_rising_value
What: /sys/.../events/in_anglvel_y_raw_thresh_falling_value
What: /sys/.../events/in_anglvel_z_raw_thresh_rising_value
What: /sys/.../events/in_anglvel_z_raw_thresh_falling_value
What: /sys/.../events/in_magn_x_raw_thresh_rising_value
What: /sys/.../events/in_magn_x_raw_thresh_falling_value
What: /sys/.../events/in_magn_y_raw_thresh_rising_value
What: /sys/.../events/in_magn_y_raw_thresh_falling_value
What: /sys/.../events/in_magn_z_raw_thresh_rising_value
What: /sys/.../events/in_magn_z_raw_thresh_falling_value
What: /sys/.../events/in_rot_from_north_magnetic_raw_thresh_rising_value
What: /sys/.../events/in_rot_from_north_magnetic_raw_thresh_falling_value
What: /sys/.../events/in_rot_from_north_true_raw_thresh_rising_value
What: /sys/.../events/in_rot_from_north_true_raw_thresh_falling_value
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_raw_thresh_rising_value
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_raw_thresh_falling_value
What: /sys/.../events/in_rot_from_north_true_tilt_comp_raw_thresh_rising_value
What: /sys/.../events/in_rot_from_north_true_tilt_comp_raw_thresh_falling_value
What: /sys/.../events/in_voltageY_supply_raw_thresh_rising_value
What: /sys/.../events/in_voltageY_supply_raw_thresh_falling_value
What: /sys/.../events/in_voltageY_raw_thresh_rising_value
What: /sys/.../events/in_voltageY_raw_thresh_falling_value
What: /sys/.../events/in_tempY_raw_thresh_rising_value
What: /sys/.../events/in_tempY_raw_thresh_falling_value
What: /sys/.../events/in_illuminance0_thresh_falling_value
what: /sys/.../events/in_illuminance0_thresh_rising_value
what: /sys/.../events/in_proximity0_thresh_falling_value
what: /sys/.../events/in_proximity0_thresh_rising_value
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Specifies the value of threshold that the device is comparing
against for the events enabled by
<type>Y[_name]_thresh[_rising|falling]_en.
If separate attributes exist for the two directions, but
direction is not specified for this attribute, then a single
threshold value applies to both directions.
The raw or input element of the name indicates whether the
value is in raw device units or in processed units (as _raw
and _input do on sysfs direct channel read attributes).
What: /sys/.../events/in_accel_x_thresh_rising_hysteresis
What: /sys/.../events/in_accel_x_thresh_falling_hysteresis
What: /sys/.../events/in_accel_x_thresh_either_hysteresis
What: /sys/.../events/in_accel_y_thresh_rising_hysteresis
What: /sys/.../events/in_accel_y_thresh_falling_hysteresis
What: /sys/.../events/in_accel_y_thresh_either_hysteresis
What: /sys/.../events/in_accel_z_thresh_rising_hysteresis
What: /sys/.../events/in_accel_z_thresh_falling_hysteresis
What: /sys/.../events/in_accel_z_thresh_either_hysteresis
What: /sys/.../events/in_anglvel_x_thresh_rising_hysteresis
What: /sys/.../events/in_anglvel_x_thresh_falling_hysteresis
What: /sys/.../events/in_anglvel_x_thresh_either_hysteresis
What: /sys/.../events/in_anglvel_y_thresh_rising_hysteresis
What: /sys/.../events/in_anglvel_y_thresh_falling_hysteresis
What: /sys/.../events/in_anglvel_y_thresh_either_hysteresis
What: /sys/.../events/in_anglvel_z_thresh_rising_hysteresis
What: /sys/.../events/in_anglvel_z_thresh_falling_hysteresis
What: /sys/.../events/in_anglvel_z_thresh_either_hysteresis
What: /sys/.../events/in_magn_x_thresh_rising_hysteresis
What: /sys/.../events/in_magn_x_thresh_falling_hysteresis
What: /sys/.../events/in_magn_x_thresh_either_hysteresis
What: /sys/.../events/in_magn_y_thresh_rising_hysteresis
What: /sys/.../events/in_magn_y_thresh_falling_hysteresis
What: /sys/.../events/in_magn_y_thresh_either_hysteresis
What: /sys/.../events/in_magn_z_thresh_rising_hysteresis
What: /sys/.../events/in_magn_z_thresh_falling_hysteresis
What: /sys/.../events/in_magn_z_thresh_either_hysteresis
What: /sys/.../events/in_rot_from_north_magnetic_thresh_rising_hysteresis
What: /sys/.../events/in_rot_from_north_magnetic_thresh_falling_hysteresis
What: /sys/.../events/in_rot_from_north_magnetic_thresh_either_hysteresis
What: /sys/.../events/in_rot_from_north_true_thresh_rising_hysteresis
What: /sys/.../events/in_rot_from_north_true_thresh_falling_hysteresis
What: /sys/.../events/in_rot_from_north_true_thresh_either_hysteresis
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_thresh_rising_hysteresis
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_thresh_falling_hysteresis
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_thresh_either_hysteresis
What: /sys/.../events/in_rot_from_north_true_tilt_comp_thresh_rising_hysteresis
What: /sys/.../events/in_rot_from_north_true_tilt_comp_thresh_falling_hysteresis
What: /sys/.../events/in_rot_from_north_true_tilt_comp_thresh_either_hysteresis
What: /sys/.../events/in_voltageY_thresh_rising_hysteresis
What: /sys/.../events/in_voltageY_thresh_falling_hysteresis
What: /sys/.../events/in_voltageY_thresh_either_hysteresis
What: /sys/.../events/in_tempY_thresh_rising_hysteresis
What: /sys/.../events/in_tempY_thresh_falling_hysteresis
What: /sys/.../events/in_tempY_thresh_either_hysteresis
What: /sys/.../events/in_illuminance0_thresh_falling_hysteresis
what: /sys/.../events/in_illuminance0_thresh_rising_hysteresis
what: /sys/.../events/in_illuminance0_thresh_either_hysteresis
what: /sys/.../events/in_proximity0_thresh_falling_hysteresis
what: /sys/.../events/in_proximity0_thresh_rising_hysteresis
what: /sys/.../events/in_proximity0_thresh_either_hysteresis
KernelVersion: 3.13
Contact: linux-iio@vger.kernel.org
Description:
Specifies the hysteresis of threshold that the device is comparing
against for the events enabled by
<type>Y[_name]_thresh[_(rising|falling)]_hysteresis.
If separate attributes exist for the two directions, but
direction is not specified for this attribute, then a single
hysteresis value applies to both directions.
For falling events the hysteresis is added to the _value attribute for
this event to get the upper threshold for when the event goes back to
normal, for rising events the hysteresis is subtracted from the _value
attribute. E.g. if in_voltage0_raw_thresh_rising_value is set to 1200
and in_voltage0_raw_thresh_rising_hysteresis is set to 50. The event
will get activated once in_voltage0_raw goes above 1200 and will become
deactived again once the value falls below 1150.
What: /sys/.../events/in_accel_x_raw_roc_rising_value
What: /sys/.../events/in_accel_x_raw_roc_falling_value
What: /sys/.../events/in_accel_y_raw_roc_rising_value
What: /sys/.../events/in_accel_y_raw_roc_falling_value
What: /sys/.../events/in_accel_z_raw_roc_rising_value
What: /sys/.../events/in_accel_z_raw_roc_falling_value
What: /sys/.../events/in_anglvel_x_raw_roc_rising_value
What: /sys/.../events/in_anglvel_x_raw_roc_falling_value
What: /sys/.../events/in_anglvel_y_raw_roc_rising_value
What: /sys/.../events/in_anglvel_y_raw_roc_falling_value
What: /sys/.../events/in_anglvel_z_raw_roc_rising_value
What: /sys/.../events/in_anglvel_z_raw_roc_falling_value
What: /sys/.../events/in_magn_x_raw_roc_rising_value
What: /sys/.../events/in_magn_x_raw_roc_falling_value
What: /sys/.../events/in_magn_y_raw_roc_rising_value
What: /sys/.../events/in_magn_y_raw_roc_falling_value
What: /sys/.../events/in_magn_z_raw_roc_rising_value
What: /sys/.../events/in_magn_z_raw_roc_falling_value
What: /sys/.../events/in_rot_from_north_magnetic_raw_roc_rising_value
What: /sys/.../events/in_rot_from_north_magnetic_raw_roc_falling_value
What: /sys/.../events/in_rot_from_north_true_raw_roc_rising_value
What: /sys/.../events/in_rot_from_north_true_raw_roc_falling_value
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_raw_roc_rising_value
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_raw_roc_falling_value
What: /sys/.../events/in_rot_from_north_true_tilt_comp_raw_roc_rising_value
What: /sys/.../events/in_rot_from_north_true_tilt_comp_raw_roc_falling_value
What: /sys/.../events/in_voltageY_supply_raw_roc_rising_value
What: /sys/.../events/in_voltageY_supply_raw_roc_falling_value
What: /sys/.../events/in_voltageY_raw_roc_rising_value
What: /sys/.../events/in_voltageY_raw_roc_falling_value
What: /sys/.../events/in_tempY_raw_roc_rising_value
What: /sys/.../events/in_tempY_raw_roc_falling_value
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Specifies the value of rate of change threshold that the
device is comparing against for the events enabled by
<type>[Y][_name]_roc[_rising|falling]_en.
If separate attributes exist for the two directions,
but direction is not specified for this attribute,
then a single threshold value applies to both directions.
The raw or input element of the name indicates whether the
value is in raw device units or in processed units (as _raw
and _input do on sysfs direct channel read attributes).
What: /sys/.../events/in_accel_x_thresh_rising_period
What: /sys/.../events/in_accel_x_thresh_falling_period
hat: /sys/.../events/in_accel_x_roc_rising_period
What: /sys/.../events/in_accel_x_roc_falling_period
What: /sys/.../events/in_accel_y_thresh_rising_period
What: /sys/.../events/in_accel_y_thresh_falling_period
What: /sys/.../events/in_accel_y_roc_rising_period
What: /sys/.../events/in_accel_y_roc_falling_period
What: /sys/.../events/in_accel_z_thresh_rising_period
What: /sys/.../events/in_accel_z_thresh_falling_period
What: /sys/.../events/in_accel_z_roc_rising_period
What: /sys/.../events/in_accel_z_roc_falling_period
What: /sys/.../events/in_anglvel_x_thresh_rising_period
What: /sys/.../events/in_anglvel_x_thresh_falling_period
What: /sys/.../events/in_anglvel_x_roc_rising_period
What: /sys/.../events/in_anglvel_x_roc_falling_period
What: /sys/.../events/in_anglvel_y_thresh_rising_period
What: /sys/.../events/in_anglvel_y_thresh_falling_period
What: /sys/.../events/in_anglvel_y_roc_rising_period
What: /sys/.../events/in_anglvel_y_roc_falling_period
What: /sys/.../events/in_anglvel_z_thresh_rising_period
What: /sys/.../events/in_anglvel_z_thresh_falling_period
What: /sys/.../events/in_anglvel_z_roc_rising_period
What: /sys/.../events/in_anglvel_z_roc_falling_period
What: /sys/.../events/in_magn_x_thresh_rising_period
What: /sys/.../events/in_magn_x_thresh_falling_period
What: /sys/.../events/in_magn_x_roc_rising_period
What: /sys/.../events/in_magn_x_roc_falling_period
What: /sys/.../events/in_magn_y_thresh_rising_period
What: /sys/.../events/in_magn_y_thresh_falling_period
What: /sys/.../events/in_magn_y_roc_rising_period
What: /sys/.../events/in_magn_y_roc_falling_period
What: /sys/.../events/in_magn_z_thresh_rising_period
What: /sys/.../events/in_magn_z_thresh_falling_period
What: /sys/.../events/in_magn_z_roc_rising_period
What: /sys/.../events/in_magn_z_roc_falling_period
What: /sys/.../events/in_rot_from_north_magnetic_thresh_rising_period
What: /sys/.../events/in_rot_from_north_magnetic_thresh_falling_period
What: /sys/.../events/in_rot_from_north_magnetic_roc_rising_period
What: /sys/.../events/in_rot_from_north_magnetic_roc_falling_period
What: /sys/.../events/in_rot_from_north_true_thresh_rising_period
What: /sys/.../events/in_rot_from_north_true_thresh_falling_period
What: /sys/.../events/in_rot_from_north_true_roc_rising_period
What: /sys/.../events/in_rot_from_north_true_roc_falling_period
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_thresh_rising_period
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_thresh_falling_period
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_roc_rising_period
What: /sys/.../events/in_rot_from_north_magnetic_tilt_comp_roc_falling_period
What: /sys/.../events/in_rot_from_north_true_tilt_comp_thresh_rising_period
What: /sys/.../events/in_rot_from_north_true_tilt_comp_thresh_falling_period
What: /sys/.../events/in_rot_from_north_true_tilt_comp_roc_rising_period
What: /sys/.../events/in_rot_from_north_true_tilt_comp_roc_falling_period
What: /sys/.../events/in_voltageY_supply_thresh_rising_period
What: /sys/.../events/in_voltageY_supply_thresh_falling_period
What: /sys/.../events/in_voltageY_supply_roc_rising_period
What: /sys/.../events/in_voltageY_supply_roc_falling_period
What: /sys/.../events/in_voltageY_thresh_rising_period
What: /sys/.../events/in_voltageY_thresh_falling_period
What: /sys/.../events/in_voltageY_roc_rising_period
What: /sys/.../events/in_voltageY_roc_falling_period
What: /sys/.../events/in_tempY_thresh_rising_period
What: /sys/.../events/in_tempY_thresh_falling_period
What: /sys/.../events/in_tempY_roc_rising_period
What: /sys/.../events/in_tempY_roc_falling_period
What: /sys/.../events/in_accel_x&y&z_mag_falling_period
What: /sys/.../events/in_intensity0_thresh_period
What: /sys/.../events/in_proximity0_thresh_period
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Period of time (in seconds) for which the condition must be
met before an event is generated. If direction is not
specified then this period applies to both directions.
What: /sys/.../iio:deviceX/events/in_accel_mag_en
What: /sys/.../iio:deviceX/events/in_accel_mag_rising_en
What: /sys/.../iio:deviceX/events/in_accel_mag_falling_en
What: /sys/.../iio:deviceX/events/in_accel_x_mag_en
What: /sys/.../iio:deviceX/events/in_accel_x_mag_rising_en
What: /sys/.../iio:deviceX/events/in_accel_x_mag_falling_en
What: /sys/.../iio:deviceX/events/in_accel_y_mag_en
What: /sys/.../iio:deviceX/events/in_accel_y_mag_rising_en
What: /sys/.../iio:deviceX/events/in_accel_y_mag_falling_en
What: /sys/.../iio:deviceX/events/in_accel_z_mag_en
What: /sys/.../iio:deviceX/events/in_accel_z_mag_rising_en
What: /sys/.../iio:deviceX/events/in_accel_z_mag_falling_en
What: /sys/.../iio:deviceX/events/in_accel_x&y&z_mag_rising_en
What: /sys/.../iio:deviceX/events/in_accel_x&y&z_mag_falling_en
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Similar to in_accel_x_thresh[_rising|_falling]_en, but here the
magnitude of the channel is compared to the threshold, not its
signed value.
What: /sys/.../events/in_accel_raw_mag_value
What: /sys/.../events/in_accel_x_raw_mag_rising_value
What: /sys/.../events/in_accel_y_raw_mag_rising_value
What: /sys/.../events/in_accel_z_raw_mag_rising_value
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
The value to which the magnitude of the channel is compared. If
number or direction is not specified, applies to all channels of
this type.
What: /sys/bus/iio/devices/iio:deviceX/trigger/current_trigger
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
The name of the trigger source being used, as per string given
in /sys/class/iio/triggerY/name.
What: /sys/bus/iio/devices/iio:deviceX/buffer/length
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Number of scans contained by the buffer.
What: /sys/bus/iio/devices/iio:deviceX/buffer/bytes_per_datum
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Bytes per scan. Due to alignment fun, the scan may be larger
than implied directly by the scan_element parameters.
What: /sys/bus/iio/devices/iio:deviceX/buffer/enable
KernelVersion: 2.6.35
Contact: linux-iio@vger.kernel.org
Description:
Actually start the buffer capture up. Will start trigger
if first device and appropriate.
What: /sys/bus/iio/devices/iio:deviceX/scan_elements
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Directory containing interfaces for elements that will be
captured for a single triggered sample set in the buffer.
What: /sys/.../iio:deviceX/scan_elements/in_accel_x_en
What: /sys/.../iio:deviceX/scan_elements/in_accel_y_en
What: /sys/.../iio:deviceX/scan_elements/in_accel_z_en
What: /sys/.../iio:deviceX/scan_elements/in_anglvel_x_en
What: /sys/.../iio:deviceX/scan_elements/in_anglvel_y_en
What: /sys/.../iio:deviceX/scan_elements/in_anglvel_z_en
What: /sys/.../iio:deviceX/scan_elements/in_magn_x_en
What: /sys/.../iio:deviceX/scan_elements/in_magn_y_en
What: /sys/.../iio:deviceX/scan_elements/in_magn_z_en
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_en
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_en
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_tilt_comp_en
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_tilt_comp_en
What: /sys/.../iio:deviceX/scan_elements/in_timestamp_en
What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_en
What: /sys/.../iio:deviceX/scan_elements/in_voltageY_en
What: /sys/.../iio:deviceX/scan_elements/in_voltageY-voltageZ_en
What: /sys/.../iio:deviceX/scan_elements/in_incli_x_en
What: /sys/.../iio:deviceX/scan_elements/in_incli_y_en
What: /sys/.../iio:deviceX/scan_elements/in_pressureY_en
What: /sys/.../iio:deviceX/scan_elements/in_pressure_en
What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_en
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Scan element control for triggered data capture.
What: /sys/.../iio:deviceX/scan_elements/in_accel_type
What: /sys/.../iio:deviceX/scan_elements/in_anglvel_type
What: /sys/.../iio:deviceX/scan_elements/in_magn_type
What: /sys/.../iio:deviceX/scan_elements/in_incli_type
What: /sys/.../iio:deviceX/scan_elements/in_voltageY_type
What: /sys/.../iio:deviceX/scan_elements/in_voltage_type
What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_type
What: /sys/.../iio:deviceX/scan_elements/in_timestamp_type
What: /sys/.../iio:deviceX/scan_elements/in_pressureY_type
What: /sys/.../iio:deviceX/scan_elements/in_pressure_type
What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_type
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
Description of the scan element data storage within the buffer
and hence the form in which it is read from user-space.
Form is [be|le]:[s|u]bits/storagebits[>>shift].
be or le specifies big or little endian. s or u specifies if
signed (2's complement) or unsigned. bits is the number of bits
of data and storagebits is the space (after padding) that it
occupies in the buffer. shift if specified, is the shift that
needs to be applied prior to masking out unused bits. Some
devices put their data in the middle of the transferred elements
with additional information on both sides. Note that some
devices will have additional information in the unused bits
so to get a clean value, the bits value must be used to mask
the buffer output value appropriately. The storagebits value
also specifies the data alignment. So s48/64>>2 will be a
signed 48 bit integer stored in a 64 bit location aligned to
a 64 bit boundary. To obtain the clean value, shift right 2
and apply a mask to zero the top 16 bits of the result.
For other storage combinations this attribute will be extended
appropriately.
What: /sys/.../iio:deviceX/scan_elements/in_accel_type_available
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
If the type parameter can take one of a small set of values,
this attribute lists them.
What: /sys/.../iio:deviceX/scan_elements/in_voltageY_index
What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_index
What: /sys/.../iio:deviceX/scan_elements/in_accel_x_index
What: /sys/.../iio:deviceX/scan_elements/in_accel_y_index
What: /sys/.../iio:deviceX/scan_elements/in_accel_z_index
What: /sys/.../iio:deviceX/scan_elements/in_anglvel_x_index
What: /sys/.../iio:deviceX/scan_elements/in_anglvel_y_index
What: /sys/.../iio:deviceX/scan_elements/in_anglvel_z_index
What: /sys/.../iio:deviceX/scan_elements/in_magn_x_index
What: /sys/.../iio:deviceX/scan_elements/in_magn_y_index
What: /sys/.../iio:deviceX/scan_elements/in_magn_z_index
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_index
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_index
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_tilt_comp_index
What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_tilt_comp_index
What: /sys/.../iio:deviceX/scan_elements/in_incli_x_index
What: /sys/.../iio:deviceX/scan_elements/in_incli_y_index
What: /sys/.../iio:deviceX/scan_elements/in_timestamp_index
What: /sys/.../iio:deviceX/scan_elements/in_pressureY_index
What: /sys/.../iio:deviceX/scan_elements/in_pressure_index
What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_index
KernelVersion: 2.6.37
Contact: linux-iio@vger.kernel.org
Description:
A single positive integer specifying the position of this
scan element in the buffer. Note these are not dependent on
what is enabled and may not be contiguous. Thus for user-space
to establish the full layout these must be used in conjunction
with all _en attributes to establish which channels are present,
and the relevant _type attributes to establish the data storage
format.
What: /sys/.../iio:deviceX/in_anglvel_z_quadrature_correction_raw
KernelVersion: 2.6.38
Contact: linux-iio@vger.kernel.org
Description:
This attribute is used to read the amount of quadrature error
present in the device at a given time.
What: /sys/.../iio:deviceX/in_accelX_power_mode
KernelVersion: 3.11
Contact: linux-iio@vger.kernel.org
Description:
Specifies the chip power mode.
low_noise: reduce noise level from ADC,
low_power: enable low current consumption.
For a list of available output power modes read
in_accel_power_mode_available.
What: /sys/bus/iio/devices/iio:deviceX/store_eeprom
KernelVersion: 3.4.0
Contact: linux-iio@vger.kernel.org
Description:
Writing '1' stores the current device configuration into
on-chip EEPROM. After power-up or chip reset the device will
automatically load the saved configuration.
iio: Add INT_TIME (integration time) channel info attribute Integration time is in seconds; it controls the measurement time and influences the gain of a sensor. There are two typical ways that scaling is implemented in a device: 1) input amplifier, 2) reference to the ADC is changed. These both result in the accuracy of the ADC varying (by applying its sampling over a more relevant range). Integration time is a way of dealing with noise inherent in the analog sensor itself. In the case of a light sensor, a mixture of photon noise and device specific noise. Photon noise is dealt with by either improving the efficiency of the sensor, (more photons actually captured) which is not easily varied dynamically, or by integrating the measurement over a longer time period. Note that this can also be thought of as an averaging of a number of individual samples and is infact sometimes implemented this way. Altering integration time implies that the duration of a measurement changes, a fact the device's user may be interested in. Hence it makes sense to distinguish between integration time and simple scale. In some devices both types of control are present and whilst they will have similar effects on the amplitude of the reading, their effect on the noise of the measurements will differ considerably. Used by adjd_s311, tsl4531, tcs3472 The following drivers have similar controls (and could be adapted): * tsl2563 (integration time is controlled via CALIBSCALE among other things) * tsl2583 (has integration_time device_attr, but driver doesn't use channels yet) * tsl2x7x (has integration_time attr) Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Cc: Jon Brenner <jon.brenner@ams.com> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-09-08 15:20:00 +00:00
What: /sys/.../iio:deviceX/in_proximity_raw
What: /sys/.../iio:deviceX/in_proximity_input
What: /sys/.../iio:deviceX/in_proximityY_raw
KernelVersion: 3.4
Contact: linux-iio@vger.kernel.org
Description:
Proximity measurement indicating that some
object is near the sensor, usually be observing
reflectivity of infrared or ultrasound emitted.
Often these sensors are unit less and as such conversion
to SI units is not possible. Where it is, the units should
be meters.
What: /sys/.../iio:deviceX/in_illuminanceY_input
What: /sys/.../iio:deviceX/in_illuminanceY_raw
What: /sys/.../iio:deviceX/in_illuminanceY_mean_raw
KernelVersion: 3.4
Contact: linux-iio@vger.kernel.org
Description:
Illuminance measurement, units after application of scale
and offset are lux.
What: /sys/.../iio:deviceX/in_intensityY_raw
What: /sys/.../iio:deviceX/in_intensityY_ir_raw
What: /sys/.../iio:deviceX/in_intensityY_both_raw
KernelVersion: 3.4
Contact: linux-iio@vger.kernel.org
Description:
Unit-less light intensity. Modifiers both and ir indicate
that measurements contains visible and infrared light
components or just infrared light, respectively.
iio: Add INT_TIME (integration time) channel info attribute Integration time is in seconds; it controls the measurement time and influences the gain of a sensor. There are two typical ways that scaling is implemented in a device: 1) input amplifier, 2) reference to the ADC is changed. These both result in the accuracy of the ADC varying (by applying its sampling over a more relevant range). Integration time is a way of dealing with noise inherent in the analog sensor itself. In the case of a light sensor, a mixture of photon noise and device specific noise. Photon noise is dealt with by either improving the efficiency of the sensor, (more photons actually captured) which is not easily varied dynamically, or by integrating the measurement over a longer time period. Note that this can also be thought of as an averaging of a number of individual samples and is infact sometimes implemented this way. Altering integration time implies that the duration of a measurement changes, a fact the device's user may be interested in. Hence it makes sense to distinguish between integration time and simple scale. In some devices both types of control are present and whilst they will have similar effects on the amplitude of the reading, their effect on the noise of the measurements will differ considerably. Used by adjd_s311, tsl4531, tcs3472 The following drivers have similar controls (and could be adapted): * tsl2563 (integration time is controlled via CALIBSCALE among other things) * tsl2583 (has integration_time device_attr, but driver doesn't use channels yet) * tsl2x7x (has integration_time attr) Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Cc: Jon Brenner <jon.brenner@ams.com> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-09-08 15:20:00 +00:00
What: /sys/.../iio:deviceX/in_intensity_red_integration_time
What: /sys/.../iio:deviceX/in_intensity_green_integration_time
What: /sys/.../iio:deviceX/in_intensity_blue_integration_time
What: /sys/.../iio:deviceX/in_intensity_clear_integration_time
What: /sys/.../iio:deviceX/in_illuminance_integration_time
KernelVersion: 3.12
Contact: linux-iio@vger.kernel.org
Description:
This attribute is used to get/set the integration time in
seconds.
What: /sys/bus/iio/devices/iio:deviceX/in_rot_quaternion_raw
KernelVersion: 3.15
Contact: linux-iio@vger.kernel.org
Description:
Raw value of quaternion components using a format
x y z w. Here x, y, and z component represents the axis about
which a rotation will occur and w component represents the
amount of rotation.
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_magnetic_tilt_comp_raw
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_true_tilt_comp_raw
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_magnetic_raw
What: /sys/bus/iio/devices/iio:deviceX/in_rot_from_north_true_raw
KernelVersion: 3.15
Contact: linux-iio@vger.kernel.org
Description:
Raw value of rotation from true/magnetic north measured with
or without compensation from tilt sensors.
What: /sys/bus/iio/devices/iio:deviceX/in_currentX_raw
KernelVersion: 3.18
Contact: linux-iio@vger.kernel.org
Description:
Raw current measurement from channel X. Units are in milliamps
after application of scale and offset. If no offset or scale is
present, output should be considered as processed with the
unit in milliamps.