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Various functions in entry.S perform test-under-mask instructions to test for particular bits in memory. Because test-under-mask uses a mask value of one byte, the mask value and the offset into the memory must be calculated manually. This easily introduces errors and is hard to review and read. Introduce the TSTMSK assembler macro to specify a mask constant and let the macro calculate the offset and the byte mask to generate a test-under-mask instruction. The benefit is that existing symbolic constants can now be used for tests. Also the macro checks for zero mask values and mask values that consist of multiple bytes. Signed-off-by: Hendrik Brueckner <brueckner@linux.vnet.ibm.com> Reviewed-by: Heiko Carstens <heiko.carstens@de.ibm.com> Signed-off-by: Martin Schwidefsky <schwidefsky@de.ibm.com> |
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