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175746eb06
The CIO layer scans for newly available I/O devices by performing a scan of available subchannels using the Store Subchannel (STSCH) instruction. Performing too many STSCH instructions in a tight loop can cause high Hypervisor overhead which can negatively impact the performance of the virtual machine as a whole. A subchannel scan is triggered for example during a hardware event that indicates that a channel path has become available. It is also triggered by the DASD device driver for each device that is set online. This patch reduces the number of STSCH instructions being performed by delaying the start of the actual subchannel scan by 1 second. Multiple scan requests that are scheduled during this time will be merged into a single scan loop. The trade-off consists of a short delay that is introduced between the time that the event is processed and a newly available device becoming usable. This delay should be acceptable since it only affects devices that have not been in use before. Signed-off-by: Peter Oberparleiter <oberpar@linux.vnet.ibm.com> Reviewed-by: Sebastian Ott <sebott@linux.vnet.ibm.com> Signed-off-by: Martin Schwidefsky <schwidefsky@de.ibm.com> |
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Makefile |