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Documentation: ABI: testing: rtq6056: Update ABI docs

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Add documentation for the usage of voltage channel integration time.

Signed-off-by: ChiYuan Huang <cy_huang@richtek.com>
Link: https://lore.kernel.org/r/1658242365-27797-4-git-send-email-u0084500@gmail.com
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
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ChiYuan Huang 2022-07-19 22:52:45 +08:00 committed by Jonathan Cameron
parent 4396f45d21
commit 7898f31b0e
1 changed files with 11 additions and 0 deletions
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Documentation/ABI/testing/sysfs-bus-iio
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@ -2038,3 +2038,14 @@ Description:
Available range for the forced calibration value, expressed as:
- a range specified as "[min step max]"
What: /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency
What: /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency
What: /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency
KernelVersion: 5.20
Contact: linux-iio@vger.kernel.org
Description:
Some devices have separate controls of sampling frequency for
individual channels. If multiple channels are enabled in a scan,
then the sampling_frequency of the scan may be computed from the
per channel sampling frequencies.