tools/testing/nvdimm: test get_config_size DSM failures

Add an nfit_test specific attribute for gating whether a get_config_size
DSM, or any DSM for that matter, succeeds or fails.  The get_config_size
DSM is initial motivation since that is the first command libnvdimm core
issues to determine the state of the namespace label area.

Signed-off-by: Dan Williams <dan.j.williams@intel.com>
This commit is contained in:
Dan Williams 2016-09-12 15:11:39 -07:00
parent aee6598748
commit 73606afd46

View File

@ -132,6 +132,8 @@ static u32 handle[NUM_DCR] = {
[4] = NFIT_DIMM_HANDLE(0, 1, 0, 0, 0),
};
static unsigned long dimm_fail_cmd_flags[NUM_DCR];
struct nfit_test {
struct acpi_nfit_desc acpi_desc;
struct platform_device pdev;
@ -414,6 +416,9 @@ static int nfit_test_ctl(struct nvdimm_bus_descriptor *nd_desc,
if (i >= ARRAY_SIZE(handle))
return -ENXIO;
if ((1 << func) & dimm_fail_cmd_flags[i])
return -EIO;
switch (func) {
case ND_CMD_GET_CONFIG_SIZE:
rc = nfit_test_cmd_get_config_size(buf, buf_len);
@ -582,6 +587,74 @@ static void put_dimms(void *data)
static struct class *nfit_test_dimm;
static int dimm_name_to_id(struct device *dev)
{
int dimm;
if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1
|| dimm >= NUM_DCR || dimm < 0)
return -ENXIO;
return dimm;
}
static ssize_t handle_show(struct device *dev, struct device_attribute *attr,
char *buf)
{
int dimm = dimm_name_to_id(dev);
if (dimm < 0)
return dimm;
return sprintf(buf, "%#x", handle[dimm]);
}
DEVICE_ATTR_RO(handle);
static ssize_t fail_cmd_show(struct device *dev, struct device_attribute *attr,
char *buf)
{
int dimm = dimm_name_to_id(dev);
if (dimm < 0)
return dimm;
return sprintf(buf, "%#lx\n", dimm_fail_cmd_flags[dimm]);
}
static ssize_t fail_cmd_store(struct device *dev, struct device_attribute *attr,
const char *buf, size_t size)
{
int dimm = dimm_name_to_id(dev);
unsigned long val;
ssize_t rc;
if (dimm < 0)
return dimm;
rc = kstrtol(buf, 0, &val);
if (rc)
return rc;
dimm_fail_cmd_flags[dimm] = val;
return size;
}
static DEVICE_ATTR_RW(fail_cmd);
static struct attribute *nfit_test_dimm_attributes[] = {
&dev_attr_fail_cmd.attr,
&dev_attr_handle.attr,
NULL,
};
static struct attribute_group nfit_test_dimm_attribute_group = {
.attrs = nfit_test_dimm_attributes,
};
static const struct attribute_group *nfit_test_dimm_attribute_groups[] = {
&nfit_test_dimm_attribute_group,
NULL,
};
static int nfit_test0_alloc(struct nfit_test *t)
{
size_t nfit_size = sizeof(struct acpi_nfit_system_address) * NUM_SPA
@ -640,8 +713,10 @@ static int nfit_test0_alloc(struct nfit_test *t)
if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t->dimm_dev))
return -ENOMEM;
for (i = 0; i < NUM_DCR; i++) {
t->dimm_dev[i] = device_create(nfit_test_dimm, &t->pdev.dev, 0,
NULL, "test_dimm%d", i);
t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm,
&t->pdev.dev, 0, NULL,
nfit_test_dimm_attribute_groups,
"test_dimm%d", i);
if (!t->dimm_dev[i])
return -ENOMEM;
}