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thermal: broadcom: Use thermal_zone_get_crit_temp() in bcm2835_thermal_probe()
Modify the bcm2835 thermal driver to use thermal_zone_get_crit_temp() in bcm2835_thermal_probe() instead of relying on the assumption that the critical trip index will always be 0. Signed-off-by: Rafael J. Wysocki <rafael.j.wysocki@intel.com> Reviewed-by: Florian Fainelli <florian.fainelli@broadcom.com> Reviewed-by: Lukasz Luba <lukasz.luba@arm.com> Link: https://patch.msgid.link/3322893.aeNJFYEL58@rjwysocki.net
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@ -208,8 +208,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
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*/
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val = readl(data->regs + BCM2835_TS_TSENSCTL);
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if (!(val & BCM2835_TS_TSENSCTL_RSTB)) {
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struct thermal_trip trip;
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int offset, slope;
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int offset, slope, crit_temp;
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slope = thermal_zone_get_slope(tz);
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offset = thermal_zone_get_offset(tz);
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@ -217,7 +216,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
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* For now we deal only with critical, otherwise
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* would need to iterate
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*/
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err = thermal_zone_get_trip(tz, 0, &trip);
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err = thermal_zone_get_crit_temp(tz, &crit_temp);
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if (err < 0) {
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dev_err(dev, "Not able to read trip_temp: %d\n", err);
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return err;
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@ -232,7 +231,7 @@ static int bcm2835_thermal_probe(struct platform_device *pdev)
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val |= (0xFE << BCM2835_TS_TSENSCTL_RSTDELAY_SHIFT);
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/* trip_adc value from info */
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val |= bcm2835_thermal_temp2adc(trip.temperature,
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val |= bcm2835_thermal_temp2adc(crit_temp,
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offset,
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slope)
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<< BCM2835_TS_TSENSCTL_THOLD_SHIFT;
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