memory: atmel-ebi: Use of_property_present() for testing DT property presence

It is preferred to use typed property access functions (i.e.
of_property_read_<type> functions) rather than low-level
of_get_property/of_find_property functions for reading properties. As
part of this, convert of_get_property/of_find_property calls to the
recently added of_property_present() helper when we just want to test
for presence of a property and nothing more.

Signed-off-by: Rob Herring <robh@kernel.org>
Link: https://lore.kernel.org/r/20230310144711.1543295-1-robh@kernel.org
Signed-off-by: Krzysztof Kozlowski <krzysztof.kozlowski@linaro.org>
This commit is contained in:
Rob Herring 2023-03-10 08:47:11 -06:00 committed by Krzysztof Kozlowski
parent d2456ddb2e
commit 538c7b5b5d

View File

@ -598,7 +598,7 @@ static int atmel_ebi_probe(struct platform_device *pdev)
reg_cells += val;
for_each_available_child_of_node(np, child) {
if (!of_find_property(child, "reg", NULL))
if (!of_property_present(child, "reg"))
continue;
ret = atmel_ebi_dev_setup(ebi, child, reg_cells);