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linux/drivers/of/selftest.c

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of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
/*
* Self tests for device tree subsystem
*/
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
#define pr_fmt(fmt) "### dt-test ### " fmt
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
#include <linux/clk.h>
#include <linux/err.h>
#include <linux/errno.h>
#include <linux/module.h>
#include <linux/of.h>
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-11 21:04:23 +00:00
#include <linux/of_irq.h>
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
#include <linux/of_platform.h>
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
#include <linux/list.h>
#include <linux/mutex.h>
#include <linux/slab.h>
#include <linux/device.h>
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-11 21:04:23 +00:00
static struct selftest_results {
int passed;
int failed;
} selftest_results;
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
#define selftest(result, fmt, ...) { \
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
if (!(result)) { \
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-11 21:04:23 +00:00
selftest_results.failed++; \
pr_err("FAIL %s():%i " fmt, __func__, __LINE__, ##__VA_ARGS__); \
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
} else { \
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-11 21:04:23 +00:00
selftest_results.passed++; \
pr_debug("pass %s():%i\n", __func__, __LINE__); \
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
} \
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
}
of/selftest: Add self tests for manipulation of properties Adds a few simple test cases to ensure that addition, update and removal of device tree node properties works correctly. Signed-off-by: Grant Likely <grant.likely@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com> Cc: Benjamin Herrenschmidt <benh@kernel.crashing.org> Cc: David S. Miller <davem@davemloft.net> Cc: Nathan Fontenot <nfont@linux.vnet.ibm.com> Cc: Pantelis Antoniou <panto@antoniou-consulting.com>
2013-11-15 17:19:09 +00:00
static void __init of_selftest_dynamic(void)
{
struct device_node *np;
struct property *prop;
np = of_find_node_by_path("/testcase-data");
if (!np) {
pr_err("missing testcase data\n");
return;
}
/* Array of 4 properties for the purpose of testing */
prop = kzalloc(sizeof(*prop) * 4, GFP_KERNEL);
if (!prop) {
selftest(0, "kzalloc() failed\n");
return;
}
/* Add a new property - should pass*/
prop->name = "new-property";
prop->value = "new-property-data";
prop->length = strlen(prop->value);
selftest(of_add_property(np, prop) == 0, "Adding a new property failed\n");
/* Try to add an existing property - should fail */
prop++;
prop->name = "new-property";
prop->value = "new-property-data-should-fail";
prop->length = strlen(prop->value);
selftest(of_add_property(np, prop) != 0,
"Adding an existing property should have failed\n");
/* Try to modify an existing property - should pass */
prop->value = "modify-property-data-should-pass";
prop->length = strlen(prop->value);
selftest(of_update_property(np, prop) == 0,
"Updating an existing property should have passed\n");
/* Try to modify non-existent property - should pass*/
prop++;
prop->name = "modify-property";
prop->value = "modify-missing-property-data-should-pass";
prop->length = strlen(prop->value);
selftest(of_update_property(np, prop) == 0,
"Updating a missing property should have passed\n");
/* Remove property - should pass */
selftest(of_remove_property(np, prop) == 0,
"Removing a property should have passed\n");
/* Adding very large property - should pass */
prop++;
prop->name = "large-property-PAGE_SIZEx8";
prop->length = PAGE_SIZE * 8;
prop->value = kzalloc(prop->length, GFP_KERNEL);
selftest(prop->value != NULL, "Unable to allocate large buffer\n");
if (prop->value)
selftest(of_add_property(np, prop) == 0,
"Adding a large property should have passed\n");
}
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
static void __init of_selftest_parse_phandle_with_args(void)
{
struct device_node *np;
struct of_phandle_args args;
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
int i, rc;
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_err("missing testcase data\n");
return;
}
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-10 22:57:21 +00:00
rc = of_count_phandle_with_args(np, "phandle-list", "#phandle-cells");
selftest(rc == 7, "of_count_phandle_with_args() returned %i, expected 7\n", rc);
of/selftest: Fix GPIOs selftest to cover the 7th case The of_gpio_named_count() self test doesn't hit the out-of-range condition even though it is coded. Fix the bug by increasing the for loop range by one. Reported-by: Andreas Larsson <andreas@gaisler.com> Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 17:41:22 +00:00
for (i = 0; i < 8; i++) {
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
bool passed = true;
rc = of_parse_phandle_with_args(np, "phandle-list",
"#phandle-cells", i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 0);
break;
case 2:
passed &= (rc == -ENOENT);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 4);
passed &= (args.args[2] == 3);
break;
case 4:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == (i + 1));
passed &= (args.args[1] == 100);
break;
case 5:
passed &= !rc;
passed &= (args.args_count == 0);
break;
case 6:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
break;
case 7:
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
passed &= (rc == -ENOENT);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
break;
default:
passed = false;
}
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
}
/* Check for missing list property */
rc = of_parse_phandle_with_args(np, "phandle-list-missing",
"#phandle-cells", 0, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
selftest(rc == -ENOENT, "expected:%i got:%i\n", -ENOENT, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-10 22:57:21 +00:00
rc = of_count_phandle_with_args(np, "phandle-list-missing",
"#phandle-cells");
selftest(rc == -ENOENT, "expected:%i got:%i\n", -ENOENT, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
/* Check for missing cells property */
rc = of_parse_phandle_with_args(np, "phandle-list",
"#phandle-cells-missing", 0, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-10 22:57:21 +00:00
rc = of_count_phandle_with_args(np, "phandle-list",
"#phandle-cells-missing");
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
/* Check for bad phandle in list */
rc = of_parse_phandle_with_args(np, "phandle-list-bad-phandle",
"#phandle-cells", 0, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-10 22:57:21 +00:00
rc = of_count_phandle_with_args(np, "phandle-list-bad-phandle",
"#phandle-cells");
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
/* Check for incorrectly formed argument list */
rc = of_parse_phandle_with_args(np, "phandle-list-bad-args",
"#phandle-cells", 1, &args);
of/selftest: Use selftest() macro throughout Some of the selftests are open-coded. Others use the selftest() macro defined in drivers/of/selftest.c. The macro makes for cleaner selftest code, so refactor the of_parse_phandle_with_args() tests to use it. Cc: Rob Herring <rob.herring@calxeda.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-02-12 21:19:37 +00:00
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Create function for counting number of phandles in a property This patch creates of_count_phandle_with_args(), a new function for counting the number of phandle+argument tuples in a given property. This is better than the existing method of parsing each phandle individually until parsing fails which is a horribly slow way to do the count. Tested on ARM using the selftest code. v3: - Rebased on top of selftest code cleanup patch v2: - fix bug where of_parse_phandle_with_args() could behave like _count_. - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO Tested-by: Andreas Larsson <andreas@gaisler.com> Signed-off-by: Grant Likely <grant.likely@secretlab.ca> Cc: Linus Walleij <linus.walleij@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com>
2013-02-10 22:57:21 +00:00
rc = of_count_phandle_with_args(np, "phandle-list-bad-args",
"#phandle-cells");
selftest(rc == -EINVAL, "expected:%i got:%i\n", -EINVAL, rc);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
}
of: Add of_property_match_string() to find index into a string list Add a helper function for finding the index of a string in a string list property. This helper is useful for bindings that use a separate *-name property for attaching names to tuples in another property such as 'reg' or 'gpios'. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:58 +00:00
static void __init of_selftest_property_match_string(void)
{
struct device_node *np;
int rc;
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_err("No testcase data in device tree\n");
return;
}
rc = of_property_match_string(np, "phandle-list-names", "first");
selftest(rc == 0, "first expected:0 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "second");
selftest(rc == 1, "second expected:0 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "third");
selftest(rc == 2, "third expected:0 got:%i\n", rc);
rc = of_property_match_string(np, "phandle-list-names", "fourth");
selftest(rc == -ENODATA, "unmatched string; rc=%i", rc);
rc = of_property_match_string(np, "missing-property", "blah");
selftest(rc == -EINVAL, "missing property; rc=%i", rc);
rc = of_property_match_string(np, "empty-property", "blah");
selftest(rc == -ENODATA, "empty property; rc=%i", rc);
rc = of_property_match_string(np, "unterminated-string", "blah");
selftest(rc == -EILSEQ, "unterminated string; rc=%i", rc);
}
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-11 21:04:23 +00:00
static void __init of_selftest_parse_interrupts(void)
{
struct device_node *np;
struct of_phandle_args args;
int i, rc;
np = of_find_node_by_path("/testcase-data/interrupts/interrupts0");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 4; i++) {
bool passed = true;
args.args_count = 0;
rc = of_irq_parse_one(np, i, &args);
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == (i + 1));
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
}
of_node_put(np);
np = of_find_node_by_path("/testcase-data/interrupts/interrupts1");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 4; i++) {
bool passed = true;
args.args_count = 0;
rc = of_irq_parse_one(np, i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 9);
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 10);
passed &= (args.args[1] == 11);
passed &= (args.args[2] == 12);
break;
case 2:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 13);
passed &= (args.args[1] == 14);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 15);
passed &= (args.args[1] == 16);
break;
default:
passed = false;
}
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
}
of_node_put(np);
}
of/irq: create interrupts-extended property The standard interrupts property in device tree can only handle interrupts coming from a single interrupt parent. If a device is wired to multiple interrupt controllers, then it needs to be attached to a node with an interrupt-map property to demux the interrupt specifiers which is confusing. It would be a lot easier if there was a form of the interrupts property that allows for a separate interrupt phandle for each interrupt specifier. This patch does exactly that by creating a new interrupts-extended property which reuses the phandle+arguments pattern used by GPIOs and other core bindings. Signed-off-by: Grant Likely <grant.likely@linaro.org> Acked-by: Tony Lindgren <tony@atomide.com> Acked-by: Kumar Gala <galak@codeaurora.org> [grant.likely: removed versatile platform hunks into separate patch] Cc: Rob Herring <rob.herring@calxeda.com>
2013-09-19 21:47:37 +00:00
static void __init of_selftest_parse_interrupts_extended(void)
{
struct device_node *np;
struct of_phandle_args args;
int i, rc;
np = of_find_node_by_path("/testcase-data/interrupts/interrupts-extended0");
if (!np) {
pr_err("missing testcase data\n");
return;
}
for (i = 0; i < 7; i++) {
bool passed = true;
rc = of_irq_parse_one(np, i, &args);
/* Test the values from tests-phandle.dtsi */
switch (i) {
case 0:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 1);
break;
case 1:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 2);
passed &= (args.args[1] == 3);
passed &= (args.args[2] == 4);
break;
case 2:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 5);
passed &= (args.args[1] == 6);
break;
case 3:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 9);
break;
case 4:
passed &= !rc;
passed &= (args.args_count == 3);
passed &= (args.args[0] == 10);
passed &= (args.args[1] == 11);
passed &= (args.args[2] == 12);
break;
case 5:
passed &= !rc;
passed &= (args.args_count == 2);
passed &= (args.args[0] == 13);
passed &= (args.args[1] == 14);
break;
case 6:
passed &= !rc;
passed &= (args.args_count == 1);
passed &= (args.args[0] == 15);
break;
default:
passed = false;
}
selftest(passed, "index %i - data error on node %s rc=%i\n",
i, args.np->full_name, rc);
}
of_node_put(np);
}
of: Add self test for of_match_node() Adds a selftest function for the of_match_node function. of_match_node is supposed to handle precedence for the compatible property as well as the name and device_type values. This patch adds some test case data and a function that makes sure each test node matches against the correct entry of an of_device_id table. This code was written to verify the new of_match_node() implementation that is an earlier part of this series. Signed-off-by: Grant Likely <grant.likely@linaro.org> Cc: Kevin Hao <haokexin@gmail.com>
2014-02-18 21:38:55 +00:00
static struct of_device_id match_node_table[] = {
{ .data = "A", .name = "name0", }, /* Name alone is lowest priority */
{ .data = "B", .type = "type1", }, /* followed by type alone */
{ .data = "Ca", .name = "name2", .type = "type1", }, /* followed by both together */
{ .data = "Cb", .name = "name2", }, /* Only match when type doesn't match */
{ .data = "Cc", .name = "name2", .type = "type2", },
{ .data = "E", .compatible = "compat3" },
{ .data = "G", .compatible = "compat2", },
{ .data = "H", .compatible = "compat2", .name = "name5", },
{ .data = "I", .compatible = "compat2", .type = "type1", },
{ .data = "J", .compatible = "compat2", .type = "type1", .name = "name8", },
{ .data = "K", .compatible = "compat2", .name = "name9", },
{}
};
static struct {
const char *path;
const char *data;
} match_node_tests[] = {
{ .path = "/testcase-data/match-node/name0", .data = "A", },
{ .path = "/testcase-data/match-node/name1", .data = "B", },
{ .path = "/testcase-data/match-node/a/name2", .data = "Ca", },
{ .path = "/testcase-data/match-node/b/name2", .data = "Cb", },
{ .path = "/testcase-data/match-node/c/name2", .data = "Cc", },
{ .path = "/testcase-data/match-node/name3", .data = "E", },
{ .path = "/testcase-data/match-node/name4", .data = "G", },
{ .path = "/testcase-data/match-node/name5", .data = "H", },
{ .path = "/testcase-data/match-node/name6", .data = "G", },
{ .path = "/testcase-data/match-node/name7", .data = "I", },
{ .path = "/testcase-data/match-node/name8", .data = "J", },
{ .path = "/testcase-data/match-node/name9", .data = "K", },
};
static void __init of_selftest_match_node(void)
{
struct device_node *np;
const struct of_device_id *match;
int i;
for (i = 0; i < ARRAY_SIZE(match_node_tests); i++) {
np = of_find_node_by_path(match_node_tests[i].path);
if (!np) {
selftest(0, "missing testcase node %s\n",
match_node_tests[i].path);
continue;
}
match = of_match_node(match_node_table, np);
if (!match) {
selftest(0, "%s didn't match anything\n",
match_node_tests[i].path);
continue;
}
if (strcmp(match->data, match_node_tests[i].data) != 0) {
selftest(0, "%s got wrong match. expected %s, got %s\n",
match_node_tests[i].path, match_node_tests[i].data,
(const char *)match->data);
continue;
}
selftest(1, "passed");
}
}
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
static void __init of_selftest_platform_populate(void)
{
int irq;
of/selftest: add testcase for nodes with same name and address Add a test case for nodes which have the same name and same non-translatable unit address. Signed-off-by: Rob Herring <robh@kernel.org> Reviewed-by: Grant Likely <grant.likely@linaro.org> Reviewed-by: Frank Rowand <frank.rowand@sonymobile.com>
2014-05-13 15:07:54 +00:00
struct device_node *np, *child;
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
struct platform_device *pdev;
of/selftest: add testcase for nodes with same name and address Add a test case for nodes which have the same name and same non-translatable unit address. Signed-off-by: Rob Herring <robh@kernel.org> Reviewed-by: Grant Likely <grant.likely@linaro.org> Reviewed-by: Frank Rowand <frank.rowand@sonymobile.com>
2014-05-13 15:07:54 +00:00
struct of_device_id match[] = {
{ .compatible = "test-device", },
{}
};
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
np = of_find_node_by_path("/testcase-data");
of_platform_populate(np, of_default_bus_match_table, NULL, NULL);
/* Test that a missing irq domain returns -EPROBE_DEFER */
np = of_find_node_by_path("/testcase-data/testcase-device1");
pdev = of_find_device_by_node(np);
of/selftest: clean-up of_selftest_platform_populate pass/fail handling Move the pass/fail checks into selftest() calls instead of a separate if condition. Unconditionally calling pass was wrong. Signed-off-by: Rob Herring <robh@kernel.org> Cc: Grant Likely <grant.likely@linaro.org>
2014-05-13 15:07:29 +00:00
selftest(pdev, "device 1 creation failed\n");
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
irq = platform_get_irq(pdev, 0);
of/selftest: clean-up of_selftest_platform_populate pass/fail handling Move the pass/fail checks into selftest() calls instead of a separate if condition. Unconditionally calling pass was wrong. Signed-off-by: Rob Herring <robh@kernel.org> Cc: Grant Likely <grant.likely@linaro.org>
2014-05-13 15:07:29 +00:00
selftest(irq == -EPROBE_DEFER, "device deferred probe failed - %d\n", irq);
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
/* Test that a parsing failure does not return -EPROBE_DEFER */
np = of_find_node_by_path("/testcase-data/testcase-device2");
pdev = of_find_device_by_node(np);
of/selftest: clean-up of_selftest_platform_populate pass/fail handling Move the pass/fail checks into selftest() calls instead of a separate if condition. Unconditionally calling pass was wrong. Signed-off-by: Rob Herring <robh@kernel.org> Cc: Grant Likely <grant.likely@linaro.org>
2014-05-13 15:07:29 +00:00
selftest(pdev, "device 2 creation failed\n");
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
irq = platform_get_irq(pdev, 0);
of/selftest: clean-up of_selftest_platform_populate pass/fail handling Move the pass/fail checks into selftest() calls instead of a separate if condition. Unconditionally calling pass was wrong. Signed-off-by: Rob Herring <robh@kernel.org> Cc: Grant Likely <grant.likely@linaro.org>
2014-05-13 15:07:29 +00:00
selftest(irq < 0 && irq != -EPROBE_DEFER, "device parsing error failed - %d\n", irq);
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
of/selftest: add testcase for nodes with same name and address Add a test case for nodes which have the same name and same non-translatable unit address. Signed-off-by: Rob Herring <robh@kernel.org> Reviewed-by: Grant Likely <grant.likely@linaro.org> Reviewed-by: Frank Rowand <frank.rowand@sonymobile.com>
2014-05-13 15:07:54 +00:00
np = of_find_node_by_path("/testcase-data/platform-tests");
if (!np) {
pr_err("No testcase data in device tree\n");
return;
}
for_each_child_of_node(np, child) {
struct device_node *grandchild;
of_platform_populate(child, match, NULL, NULL);
for_each_child_of_node(child, grandchild)
selftest(of_find_device_by_node(grandchild),
"Could not create device for node '%s'\n",
grandchild->name);
}
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
}
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
static int __init of_selftest(void)
{
struct device_node *np;
np = of_find_node_by_path("/testcase-data/phandle-tests/consumer-a");
if (!np) {
pr_info("No testcase data in device tree; not running tests\n");
return 0;
}
of_node_put(np);
pr_info("start of selftest - you will see error messages\n");
of/selftest: Add self tests for manipulation of properties Adds a few simple test cases to ensure that addition, update and removal of device tree node properties works correctly. Signed-off-by: Grant Likely <grant.likely@linaro.org> Cc: Rob Herring <rob.herring@calxeda.com> Cc: Benjamin Herrenschmidt <benh@kernel.crashing.org> Cc: David S. Miller <davem@davemloft.net> Cc: Nathan Fontenot <nfont@linux.vnet.ibm.com> Cc: Pantelis Antoniou <panto@antoniou-consulting.com>
2013-11-15 17:19:09 +00:00
of_selftest_dynamic();
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
of_selftest_parse_phandle_with_args();
of: Add of_property_match_string() to find index into a string list Add a helper function for finding the index of a string in a string list property. This helper is useful for bindings that use a separate *-name property for attaching names to tuples in another property such as 'reg' or 'gpios'. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:58 +00:00
of_selftest_property_match_string();
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-11 21:04:23 +00:00
of_selftest_parse_interrupts();
of/irq: create interrupts-extended property The standard interrupts property in device tree can only handle interrupts coming from a single interrupt parent. If a device is wired to multiple interrupt controllers, then it needs to be attached to a node with an interrupt-map property to demux the interrupt specifiers which is confusing. It would be a lot easier if there was a form of the interrupts property that allows for a separate interrupt phandle for each interrupt specifier. This patch does exactly that by creating a new interrupts-extended property which reuses the phandle+arguments pattern used by GPIOs and other core bindings. Signed-off-by: Grant Likely <grant.likely@linaro.org> Acked-by: Tony Lindgren <tony@atomide.com> Acked-by: Kumar Gala <galak@codeaurora.org> [grant.likely: removed versatile platform hunks into separate patch] Cc: Rob Herring <rob.herring@calxeda.com>
2013-09-19 21:47:37 +00:00
of_selftest_parse_interrupts_extended();
of: Add self test for of_match_node() Adds a selftest function for the of_match_node function. of_match_node is supposed to handle precedence for the compatible property as well as the name and device_type values. This patch adds some test case data and a function that makes sure each test node matches against the correct entry of an of_device_id table. This code was written to verify the new of_match_node() implementation that is an earlier part of this series. Signed-off-by: Grant Likely <grant.likely@linaro.org> Cc: Kevin Hao <haokexin@gmail.com>
2014-02-18 21:38:55 +00:00
of_selftest_match_node();
of: selftest: add deferred probe interrupt test Signed-off-by: Rob Herring <robh@kernel.org> [grant.likely: fixed failure when root node specifies the interrupt parent] Signed-off-by: Grant Likely <grant.likely@linaro.org>
2014-04-23 22:57:40 +00:00
of_selftest_platform_populate();
of: Add testcases for interrupt parsing This patch extends the DT selftest code with some test cases for the interrupt parsing functions. Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2013-10-11 21:04:23 +00:00
pr_info("end of selftest - %i passed, %i failed\n",
selftest_results.passed, selftest_results.failed);
of: Add device tree selftests Add some runtime test cases for the library of device tree parsing functions. v2: - Add testcase for phandle with 0 args - Don't run testcases if testcase data isn't present in device tree Signed-off-by: Grant Likely <grant.likely@secretlab.ca>
2011-12-12 16:25:57 +00:00
return 0;
}
late_initcall(of_selftest);
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